A pull-to-bend testing technique for testing Single crystal Silicon
A pull-to-bend testing technique for testing Single crystal Silicon
- Date: Aug 3, 2016
- Time: 11:00 AM - 11:30 AM (Local Time Germany)
- Speaker: Mohamed M Rashad Ibrahim Elhebeary
- University of Illinois at Urbana-Champaign, USA
- Location: Max-Planck-Institut für Eisenforschung GmbH
- Room: Room 1034 Hall 9
- Host: Prof. Gerhard Dehm
- Contact: stein@mpie.de