Zaefferer, S.: Some topics of experimental texture and microstructure research at the MPIE. Intern. Workshop on Modern Texture Research in Engineering Materials (MoteX), Düsseldorf (2003)

Zaefferer, S.: Microstructural characterization of low alloyed TRIP steels by SEM and TEM techniques. Seminar des Instituts für Eisenhüttenkunde der RWTH Aachen, RWTH Aachen, Germany (2003)

Zaefferer, S.: Microtexture measurements: A powerful tool to understand microstructures. Seminar des Geologischen Instituts, Bochum, Germany (2003)

Zaefferer, S.: Microtexture measurements: A powerful tool to understand microstructures. Fachvortrag bei der Sitzung des Fachbeirates des Instituts, Düsseldorf, Düsseldorf (2003)

Kobayashi, S.; Zaefferer, S.; Schneider, A.; Raabe, D.; Frommeyer, G.: Slip system determination by rolling texture measurements around the strength peak temperature in a Fe₃Al-based alloy. Intern. Conf. on Strength of Materials (ICSMA 13), Budapest, Hungary (2003)

Abdellaoui, L.; Zhang, S.; Chen, Z.; Zaefferer, S.; Bueno Villoro, R.; Gault, B.; Yu, Y.; Rodenkirchen, C.; Cojocaru-Mirédin, O.; Amouyal, Y. et al.; Snyder, G. J.; Raabe, D.; Scheu, C.: Thermoelectric Materials: A methodology for defects characterizaton. Understanding Transport Processes on the Nanoscale for Energy Harvesting Devices Seminar, Physikzentrum Bad Honnef, Bad Honnef, Germany (2021)

Abdellaoui, L.; Zhang, S.; Bueno Villoro, R.; Zaefferer, S.; Yu, Y.; Rodenkirchen, C.; Amouyal, Y.; Scheu, C.: Stacking faults in AgSbTe₂ thermoelectric alloys. Virtual Thermoelectric Conference (VCT 2020), Seattle, WA, USA (2020)

Abdellaoui, L.; Zhang, S.; Rodenkirchen, C.; Zaefferer, S.; Bueno Villoro, R.; Guen, E.; Chapuis, P.-O.; Gomès, S.; Cojocaru-Mirédin, O.; Yu, Y. et al.; Amouyal, Y.; Raabe, D.; Snyder, G. J.; Scheu, C.: Thermoelectric Materials: a methodology for defects – properties correlation. International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano, Düsseldorf, Germany (2019)

Konijnenberg, P. J.; Stechmann, G.; Zaefferer, S.; Raabe, D.: Recent Developments in the Analysis of Microstructures by 3D-EBSD. Microscience Microscopy Congress 2019, Manchester, UK (2019)

Tripathi, A.; Zaefferer, S.: Quantifying the resolution of EBSD in light metals. RMS EBSD meeting 2018, Plymouth, UK (2018)

Archie, F. M. F.; Zaefferer, S.: Micro-damage initiation in advanced high strength steels (AHSS): Influence of Prior Austenite Grain Boundaries. Meeting Materials 2016 - M2i - Materials innovation institute, Nieuwegein, The Netherlands (2016)

Stechmann, G.; Zaefferer, S.; Konijnenberg, P. J.: Microstructural and Electronic Characterization of CdTe Thin Film Solar Cells: A Correlative SEM-Based Approach. IAMNano, Port Elizabeth, South Africa (2016)

Archie, F. M. F.; Zaefferer, S.: Micro-damage initiation in ferritic-martensitic DP microstructures. Thermec 2016, Graz, Austria (2016)

Stechmann, G.; Zaefferer, S.: Microstructural and Electronic Characterization of CdTe Thin Film Solar Cells: A Correlative SEM-Based Approach. IAMNano, Hamburg, Germany (2015)

Archie, F. M. F.; Zaefferer, S.: Strain Localization in DP Steels: Influence of Grain and Interphase Boundaries. GLADD Meeting, Leuven, Belgium (2015)

Zaefferer, S.; Zhu, Z.; Reed, R. C.: Observation of Dislocation Evolution during Straining of a γ-γ’ Superalloy Single Crystal using the CECCI technique. Eurosuperalloys 2014, Giens, France (2014)

Archie, F. M. F.; Zaefferer, S.; Raabe, D.: The influence of grain boundary character on dislocation densities and fracture toughness in AHSS. M2i Conference "High Tech Materials: your world - our business", Sint Michielgestel, The Netherlands (2014)

Ram, F.; Zaefferer, S.: Error Analysis of the Crystal Orientations and Misorientations obtained by the Classical Electron Backscatter Diffraction Method. IMC 2014, Prague, Czech Republic (2014)

Ram, F.; Zaefferer, S.: Error Analysis of the Crystal Orientations and Misorientations obtained by the Classical Electron Backscatter Diffraction Method. MSE 2014, Darmstadt, Germny (2014)

Ram, F.; Zaefferer, S.; Jäpel, T.: Error Analysis of the Crystal Orientations and Misorientations obtained by the Classical Electron Backscatter Diffraction Method. RMS EBSD 2014, London, UK (2014)