Zaefferer, S.: 3D-orientation microscopy in a FIB SEM: Techniques, applications and limits. Cacemi-formation EBSD, Université de Metz, France (2007)

Zaefferer, S.: Possibilities and Limits of Phase Identification by combined Electron Backscatter Diffraction (EBSD) and Energy Dispersive X-ray spectroscopy (EDX). Cacemi-formation EBSD, Université de Metz, France (2007)

Imlau, J.; Zaefferer, S.: Crack Development in Dependence of the Local Microstructure in TRIP Steels. EUROMAT 2007, Nürnberg, Germany (2007)

Thiessen, R.; Zaefferer, S.: In-situ Investigation into Damage Mechanisms in TRIP Steel. EUROMAT 2007, Nürnberg, Germany (2007)

Bastos, A.; Zaefferer, S.; Raabe, D.: Microstructure evolution during electrodeposits film growth. EUROMAT 2007, Nürnberg, Germany (2007)

Zaefferer, S.: 3D-orientation microscopy in a FIB SEM: A new dimension of microstructure characterisation. EUROMAT 2007, Nürnberg, Germany (2007)

Zaefferer, S.: Some ideas on the formation mechanisms and intensity distribution of backscatter Kikuchi patterns. M&M 2007, Microscopy and Microanalysis 2007 Meeting, Ft. Lauderdale, USA (2007)

Zaefferer, S.; Wright, S. I.; Raabe, D.: 3D-orientation microscopy in a FIB SEM: A new dimension of microstructure characterisation. M&M 2007, Microscopy and Microanalysis 2007 Meeting, Ft. Lauderdale, FL, USA (2007)

Raabe, D.; Zaafarani, N.; Roters, F.; Zaefferer, S.: 3D studies on orientation patterning below nanoindents in Cu single crystals using 3D EBSD and crystal plasticity finite element simulations. 3rd Intern. Indentation Workshop, Cavendish Lab., Cambridge, UK (2007)

Bastos, A.; Zaefferer, S.; Raabe, D.: 3D Orientation microscopy. 1st Annual EDAX EBSD German User's Group Meeting, Wiesbaden, Germany (2007)

Zaefferer, S.: 3D orientation microscopy in a FIB-SEM: A new dimension of microstructure characterisation. 10th SFµ Annual Colloquium, Grenoble, France (2007)

Romano, P.; Zaefferer, S.: Identification of Bainite in Al-TRIP Steels using orientation microscopy. 14th Conference on Electron Backscatter Diffraction, New Lanark, Scotland, UK (2007)

Zaefferer, S.: Some ideas on the formation mechanisms and intensity of electron backscatter diffraction patterns. 14th Conference on Electron Backscatter Diffraction, New Lanark, Scotland, UK (2007)

Zaefferer, S.: Progress in 3D EBSD-based orientation microscopy. 14th Conference on Electron Backscatter Diffraction, New Lanark, Scotland, UK (2007)

Bastos, A.; Zaafarani, N.; Zaefferer, S.; Raabe, D.: Overview on 3D EBSD. Deutsche Gesellschaft für Materialkunde e.V., Fachausschuss Texturen, RWTH Aachen, Germany (2007)

Bastos, A.; Zaefferer, S.; Raabe, D.: 3D Orientation microscopy. Deutsche Gesellschaft für Materialkunde e.V. Fachausschuss Texturen, RWTH Aachen, Germany (2007)

Zaefferer, S.: 3D orientation microscopy in a FIB-SEM: A new dimension of microstructure characterisation. Res Metallica Chair 2007, KU Leuven, Belgium (2007)

Zaefferer, S.: 3D orientation microscopy in a FIB-SEM: A new dimension of microstructure characterisation. Presentation at the scientific advisory board MPI Eisenforschung, MPI Eisenforschung GmbH, Düsseldorf, Germany (2007)

Bastos, A.; Zaefferer, S.; Raabe, D.: 3D EBSD Characterization of a Nanocrystalline NiCo Alloy by use of a High-resolution Field Emission SEM-EBSD Coupled with Serial Sectioning in a Focused Ion Beam Microscope (FIB). MRS Fall Conference, Boston, MA, USA (2006)

Bastos, A.; Zaefferer, S.; Raabe, D.: 3D Orientation microscopy in a FIB – SEM. SBPMat 2006 - Brazilian MRS - meeting, Florianópolis, Brazil (2006)