
Publications
Journal Article (10)
1.
Journal Article
7 (1), 7762819, pp. 313 - 321 (2017)
Cd and Impurity Redistribution at the CdS/CIGS Interface After Annealing of CIGS-Based Solar Cells Resolved by Atom Probe Tomography. IEEE Journal of Photovoltaics 2.
Journal Article
115 (23), 235502 (2015)
Complex Nanotwin Substructure of an Asymmetric Σ9 Tilt Grain Boundary in a Silicon Polycrystal. Physical Review Letters 3.
Journal Article
23 (12), pp. 1742 - 1753 (2015)
Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography. Progress in Photovoltaics: Research and Applications 4.
Journal Article
23 (6), pp. 705 - 716 (2015)
Interface engineering and characterization at the atomic-scale of pure and mixed ion layer gas reaction buffer layers in chalcopyrite thin-film solar cells. Progress in Photovoltaics: Research and Applications 5.
Journal Article
107 (17), 172102 (2015)
Detection of Cu2Zn5SnSe8 and Cu2Zn6SnSe9 phases in co-evaporated Cu2ZnSnSe4 thin-films. Applied Physics Letters 6.
Journal Article
115 (15), 154501 (2014)
Investigation of the diffusion behavior of sodium in Cu(In,Ga)Se2 layers. Journal of Applied Physics 7.
Journal Article
115 (10), 103507 (2014)
Origins of electrostatic potential wells at dislocations in polycrystalline Cu(In,Ga)Se2 thin films. Journal of Applied Physics 8.
Journal Article
534, pp. 62 - 66 (2013)
Extended defects and precipitation in heavily B-doped silicon. Thin Solid Films 9.
Journal Article
74, e50376 (2013)
Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries. Journal of Visualized Experiments 10.
Journal Article
102, 042101, pp. 1 - 4 (2013)
Atom probe study of Cu2ZnSnSe4 thin-films prepared by co-evaporation and post-deposition annealing. Applied Physics Letters Book Chapter (1)
11.
Book Chapter
2-2, pp. 523 - 567. wiley, Hoboken, NJ, USA (2016)
Accessing Elemental Distributions in Thin Films for Solar Cells. In: Advanced Characterization Techniques for Thin Film Solar Cells: Second Edition, Vol. Conference Paper (3)
12.
Conference Paper
Interface engineering and nanoscale characterization of Zn(S,O) alternative buffer layer for CIGS thin film solar cells. In: 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015, 7355889. 42nd Photovoltaic Specialist Conference, PVSC 2015, Category numberCFP15PSC-ART; Code 118514, New Orleans, LA, USA, June 14, 2015 - June 19, 2015. Institute of Electrical and Electronics Engineers Inc., Piscataway Township, NJ, USA (2015)
13.
Conference Paper
Cd and impurity redistribution at the p-n junction of CIGS based solar cells resolved by atom-probe tomography. In: Photovoltaic Specialist Conference (PVSC), pp. 1 - 6 (Ed. IEEE ). Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd , New Orleans, LA, USA, June 14, 2015 - June 19, 2015. (2015)
14.
Conference Paper
Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. In: 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014, 6925089, pp. 42 - 46. 40th IEEE Photovoltaic Specialist Conference, PVSC 2014, Denver, CO, USA, June 08, 2014 - June 13, 2014. (2014)
Talk (29)
15.
Talk
Calibration of Atom Probe Tomography Reconstructions from Correlation with Electron Tomograms or Micrographs. APT&M 2018, NIST, Gaithersburg, MD, USA (2018)
16.
Talk
Correlative transmission Kikuchi diffraction and atom probe tomography analysis of grain boundaries in Cu(In,Ga) Se2 and CuInS2. E-MRS Spring Meeting 2018, Strasbourg, France (2018)
17.
Talk
Correlative transmission Kikuchi diffraction and atom probe tomography analysis of grain boundaries in Cu(In,Ga) Se2 and CuInS2 in thin film solar cells. APT&M 2018, NIST, Gaithersburg, MD, USA (2018)
18.
Talk
Textures Studied at Near Atomic-Scale. 18th International Conference on Textures of Materials (ICOTOM-18), St. George, UT, USA (2017)
19.
Talk
Multiprobe and Multiscale Characterisation of complex Materials. Fraunhofer Conference ‘The Future of Materials – Materials Future‘, Halle, Germany (2017)
20.
Talk
Advanced Atom Probe Tomography. 25th Annual Meeting of the German Crystallographic Society, Karlsruhe, Germany (2017)