Publications

Header image 1550748174

Publications

Journal Article (10)

  1. 1.
    Journal Article
    Koprek, A.; Cojocaru-Mirédin, O.; Würz, R.; Freysoldt, C.; Gault, B.; Raabe, D.: Cd and Impurity Redistribution at the CdS/CIGS Interface After Annealing of CIGS-Based Solar Cells Resolved by Atom Probe Tomography. IEEE Journal of Photovoltaics 7 (1), 7762819, pp. 313 - 321 (2017)
  2. 2.
    Journal Article
    Stoffers, A.; Ziebarth, B.; Barthel, J.; Cojocaru-Mirédin, O.; Elsässer, C.; Raabe, D.: Complex Nanotwin Substructure of an Asymmetric Σ9 Tilt Grain Boundary in a Silicon Polycrystal. Physical Review Letters 115 (23), 235502 (2015)
  3. 3.
    Journal Article
    Stoffers, A.; Cojocaru-Mirédin, O.; Seifert, W.; Zaefferer, S.; Riepe, S.; Raabe, D.: Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography. Progress in Photovoltaics: Research and Applications 23 (12), pp. 1742 - 1753 (2015)
  4. 4.
    Journal Article
    Cojocaru-Mirédin, O.; Fu, Y.; Kostka, A.; Sáez-Araoz, R.; Beyer, A.; Knaub, N.; Volz, K.; Fischer, C.-H.; Raabe, D.: Interface engineering and characterization at the atomic-scale of pure and mixed ion layer gas reaction buffer layers in chalcopyrite thin-film solar cells. Progress in Photovoltaics: Research and Applications 23 (6), pp. 705 - 716 (2015)
  5. 5.
    Journal Article
    Schwarz, T.; Marques, M.; Botti, S.; Mousel, M.; Redinger, A.; Siebentritt, S.; Cojocaru-Mirédin, O.; Raabe, D.; Choi, P.-P.: Detection of Cu2Zn5SnSe8 and Cu2Zn6SnSe9 phases in co-evaporated Cu2ZnSnSe4 thin-films. Applied Physics Letters 107 (17), 172102 (2015)
  6. 6.
    Journal Article
    Laemmle, A.; Wuerz, R.; Schwarz, T.; Cojocaru-Mirédin, O.; Choi, P.-P.; Powalla, M.: Investigation of the diffusion behavior of sodium in Cu(In,Ga)Se2 layers. Journal of Applied Physics 115 (15), 154501 (2014)
  7. 7.
    Journal Article
    Dietrich, J.; Abou-Ras, D.; Schmidt, S. S.; Rissom, T.; Unold, T.; Cojocaru-Mirédin, O.; Niermann, T.; Lehmann, M. M.; Koch, C. T.; Boit, C.: Origins of electrostatic potential wells at dislocations in polycrystalline Cu(In,Ga)Se2 thin films. Journal of Applied Physics 115 (10), 103507 (2014)
  8. 8.
    Journal Article
    Cojocaru-Mirédin, O.; Cristiano, F.; Fazzini, P.-F.; Mangelinck, D.; Blavette, D.: Extended defects and precipitation in heavily B-doped silicon. Thin Solid Films 534, pp. 62 - 66 (2013)
  9. 9.
    Journal Article
    Cojocaru-Mirédin, O.; Schwarz, T.; Choi, P.; Herbig, M.; Würz, R.; Raabe, D.: Atom Probe Tomography Studies on the Cu(In,Ga)Se2 Grain Boundaries. Journal of Visualized Experiments 74, e50376 (2013)
  10. 10.
    Journal Article
    Schwarz, T.; Cojocaru-Mirédin, O.; Choi, P.; Mousel, M.; Redinger, A.; Siebentritt, S.; Raabe, D.: Atom probe study of Cu2ZnSnSe4 thin-films prepared by co-evaporation and post-deposition annealing. Applied Physics Letters 102, 042101, pp. 1 - 4 (2013)

Book Chapter (1)

  1. 11.
    Book Chapter
    Hoffmann, V.; Klemm, D.; Brackmann, V.; Venzago, C.; Rockett, A. A.; Wirth, T.; Nunney, T. S.; Kaufmann, C. A.; Caballero, R.; Cojocaru-Mirédin, O.: Accessing Elemental Distributions in Thin Films for Solar Cells. In: Advanced Characterization Techniques for Thin Film Solar Cells: Second Edition, Vol. 2-2, pp. 523 - 567. wiley, Hoboken, NJ, USA (2016)

Conference Paper (3)

  1. 12.
    Conference Paper
    Soni, P. U.; Cojocaru-Mirédin, O.; Raabe, D.: Interface engineering and nanoscale characterization of Zn(S,O) alternative buffer layer for CIGS thin film solar cells. In: 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015, 7355889. 42nd Photovoltaic Specialist Conference, PVSC 2015, Category numberCFP15PSC-ART; Code 118514, New Orleans, LA, USA, June 14, 2015 - June 19, 2015. Institute of Electrical and Electronics Engineers Inc., Piscataway Township, NJ, USA (2015)
  2. 13.
    Conference Paper
    Koprek, A.; Cojocaru-Mirédin, O.; Würz, R.; Freysoldt, C.; Raabe, D.: Cd and impurity redistribution at the p-n junction of CIGS based solar cells resolved by atom-probe tomography. In: Photovoltaic Specialist Conference (PVSC), pp. 1 - 6 (Ed. IEEE ). Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd , New Orleans, LA, USA, June 14, 2015 - June 19, 2015. (2015)
  3. 14.
    Conference Paper
    Stoffers, A.; Cojocaru-Mirédin, O.; Breitenstein, O.; Seifert, W.; Zaefferer, S.; Raabe, D.: Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. In: 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014, 6925089, pp. 42 - 46. 40th IEEE Photovoltaic Specialist Conference, PVSC 2014, Denver, CO, USA, June 08, 2014 - June 13, 2014. (2014)

Talk (29)

  1. 15.
    Talk
    Mouton, I.; Katnagallu, S.; Schwarz, T.; Makineni, S. K.; Printemps, T.; Grenier, A.; Barnes, J. P.; Cojocaru-Mirédin, O.; Raabe, D.; Gault, B.: Calibration of Atom Probe Tomography Reconstructions from Correlation with Electron Tomograms or Micrographs. APT&M 2018, NIST, Gaithersburg, MD, USA (2018)
  2. 16.
    Talk
    Schwarz, T.; Stechmann, G.; Gault, B.; Cojocaru-Mirédin, O.; Würz, R.; Lomuscio, A.; Siebentritt, S.; Raabe, D.: Correlative transmission Kikuchi diffraction and atom probe tomography analysis of grain boundaries in Cu(In,Ga) Se2 and CuInS2. E-MRS Spring Meeting 2018, Strasbourg, France (2018)
  3. 17.
    Talk
    Schwarz, T.; Stechmann, G.; Gault, B.; Cojocaru-Mirédin, O.; Würz, R.; Lomuscio, A.; Siebentritt, S.; Raabe, D.: Correlative transmission Kikuchi diffraction and atom probe tomography analysis of grain boundaries in Cu(In,Ga) Se2 and CuInS2 in thin film solar cells. APT&M 2018, NIST, Gaithersburg, MD, USA (2018)
  4. 18.
    Talk
    Raabe, D.; Gault, B.; Breen, A. J.; Yao, M.; Zhao, H.; Ponge, D.; Stoffers, A.: Textures Studied at Near Atomic-Scale. 18th International Conference on Textures of Materials (ICOTOM-18), St. George, UT, USA (2017)
  5. 19.
    Talk
    Raabe, D.; Gault, B.; Breen, A. J.; Chang, Y.; Yao, M.; Ponge, D.; Herbig, M.; Liebscher, C.; Tarzimoghadam, Z.; Dehm, G. et al.; Scheu, C.; Stoffers, A.; Neugebauer, J.: Multiprobe and Multiscale Characterisation of complex Materials. Fraunhofer Conference ‘The Future of Materials – Materials Future‘, Halle, Germany (2017)
  6. 20.
    Talk
    Raabe, D.; Gault, B.; Breen, A. J.; Chang, Y.; Yao, M.; Ponge, D.; Herbig, M.; Liebscher, C.; Dehm, G.; Scheu, C. et al.; Stoffers, A.; Neugebauer, J.: Advanced Atom Probe Tomography. 25th Annual Meeting of the German Crystallographic Society, Karlsruhe, Germany (2017)
 
loading content
Go to Editor View