Publications of Pascal Bliem

Stelzer, B.; Chen, X.; Bliem, P.; Hans, M.; Völker, B.; Sahu, R.; Scheu, C.; Primetzhofer, D.; Schneider, J. M.: Remote Tracking of Phase Changes in Cr₂AlC Thin Films by In-situ Resistivity Measurements. Scientific Reports 9, 8266 (2019)