Publications of Stephan Riepe

Stoffers, A.; Cojocaru-Mirédin, O.; Seifert, W.; Zaefferer, S.; Riepe, S.; Raabe, D.: Grain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography. Progress in Photovoltaics: Research and Applications 23 (12), pp. 1742 - 1753 (2015)