Rechmann, J.; Krzywiecki, M.; Erbe, A.: Carbon-Sulfur Bond Cleavage During Adsorption of Octadecane Thiol to Copper in Ethanol. Langmuir 35 (21), pp. 6888 - 6897 (2019)
Krzywiecki, M.; Grządziel, L.; Powroźnik, P.; Kwoka, M.; Rechmann, J.; Erbe, A.: Oxide – organic heterostructures: a case study of charge displacement absence at a SnO2 – copper phthalocyanine buried interface. Physical Chemistry Chemical Physics 20 (23), pp. 16092 - 16101 (2018)
Mondragón Ochooa, J. S.; Altin, A.; Rechmann, J.; Erbe, A.: Delamination Kinetics of Thin Film Poly(acrylate) Model Coatings Prepared by Surface Initiated Atom Transfer Radical Polymerization on Iron. Journal of the Electrochemical Society 165 (16), pp. C991 - C998 (2018)
Panther, J.; Rechmann, J.; Müller, T. J. J.: Fischer indole synthesis of 3-benzyl-1H-indole via conductive and dielectric heating. Chemistry of Heterocyclic Compounds 52 (11) (2016)
Rabe, M.; Rechmann, J.; Boyle, A. L.; Erbe, A.: Designing Electro Responsive Self-Assembled Monolayers Based on the Coiled-Coil Peptide Binding Motif. 17th International Conference on Organized Molecular Films” (ICOMF17), New York, NY, USA (2018)
Rechmann, J.: Electron transfer characteristics of gold and oxide-covered copper in aqueous electrolytes modified by self-assembled monolayers. ElecNano8, the 8th international conference on Electrochemistry in Nanosciences
, Nancy, France (2018)
Rechmann, J.: Oberflächenmodifizierung von Zink (Eisen) mit Ethinylphenothiazinen und Charakterisierung. Master, Institut für Organische und Makromolekulare Chemie, Heinrich-Heine-Universität Düsseldorf, Düsseldorf, Germany (2014)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
In order to prepare raw data from scanning transmission electron microscopy for analysis, pattern detection algorithms are developed that allow to identify automatically higher-order feature such as crystalline grains, lattice defects, etc. from atomically resolved measurements.