Lymperakis, L.; Neugebauer, J.: Thermodynamics and adatom kinetic on non-polar GaN surfaces: origin of a strong growth anisotropy. E-MRS Spring meeting, Strasbourg, France (2008)
Lymperakis, L.; Neugebauer, J.: Ab-initio based calculation of GaN surfaces, interfaces, and extended defects. Colloquium Paul-Drude-Institut Berlin, Berlin, Germany (2008)
Marquardt, O.; Hickel, T.; Neugebauer, J.: Optical properties of semiconductor nanostructures including strain and piezoelectric effects. PARSEM meeting and workshop, Cambridge, UK (2008)
Hickel, T.; Uijttewaal, M.; Neugebauer, J.: Ab initio Investigations of Temperature Dependent Effects in MSM Alloys. Antragskolloquium SPP1239, Dresden, Germany (2008)
Neugebauer, J.: Optimizing materials properties and epitaxial growth of semiconductor devices by ab initio based multiscale modeling. Workshop "Molecular Modelling and Simulation in Applied Materials Science", Frankfurt a. M., Germany (2008)
Counts, W. A.; Friák, M.; Raabe, D.; Neugebauer, J.: Using Ab Initio to Predict Engineering Parameters in bcc Magnesium-Lithium Alloys. American Physics Society March Meeting, New Orleans, LA, USA (2008)
Abu-Farsakh, H.; Neugebauer, J.: Enhancing N solubility in diluted nitrides by surface kinetics: An ab-initio study. Spring meeting of the German Physical Society (DPG), Berlin, Germany (2008)
Freysoldt, C.; Neugebauer, J.: Charged defects in a supercell formalism: From an empirical to a fully ab-initio treatment of finite-size effects. Spring meeting of the German Physical Society (DPG), Berlin, Germany (2008)
Grabowski, B.; Ismer, L.; Hickel, T.; Neugebauer, J.: Ab initio up to the melting point: Influence of vacancies and explicit anharmonicity. Spring meeting of the German Physical Society (DPG), Berlin, Germany (2008)
Kim, O.; Friák, M.; Neugebauer, J.: Ab initio analysis of the carbon solubility limits in various iron phases. Spring meeting of the German Physical Society (DPG), Berlin, Germany (2008)
Lymperakis, L.; Neugebauer, J.: Thermodynamics and adatom kinetics of non-polar GaN surfaces. Spring meeting of the German Physical Society (DPG), Berlin, Germany (2008)
Marquardt, O.; Hickel, T.; Neugebauer, J.: Plane-wave implementation of the k.p-formalism including strain and piezoelectricity to study the optical properties of semiconductor nanostructures. Spring meeting of the German Physical Society (DPG), Berlin, Germany (2008)
Todorova, M.; Neugebauer, J.: A new approach to obtain electrochemical E/pH diagrams derived from the viewpoint of semiconductor defects. Spring meeting of the German Physical Society (DPG), Berlin, Germany (2008)
Udyansky, A.; Friák, M.; Neugebauer, J.: An ab-initio study of the phase transitions in the interstitial Fe–C solid solutions. Spring meeting of the German Physical Society (DPG), Berlin, Germany (2008)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Integrated Computational Materials Engineering (ICME) is one of the emerging hot topics in Computational Materials Simulation during the last years. It aims at the integration of simulation tools at different length scales and along the processing chain to predict and optimize final component properties.
Data-rich experiments such as scanning transmission electron microscopy (STEM) provide large amounts of multi-dimensional raw data that encodes, via correlations or hierarchical patterns, much of the underlying materials physics. With modern instrumentation, data generation tends to be faster than human analysis, and the full information content is…
The project’s goal is to synergize experimental phase transformations dynamics, observed via scanning transmission electron microscopy, with phase-field models that will enable us to learn the continuum description of complex material systems directly from experiment.
In order to prepare raw data from scanning transmission electron microscopy for analysis, pattern detection algorithms are developed that allow to identify automatically higher-order feature such as crystalline grains, lattice defects, etc. from atomically resolved measurements.