Publications of Christof H. Wöll

Fu, Z.; Ladnorg, T.; Gliemann, H.; Welle, A.; Bashir, A.; Rohwerder, M.; Zhang, Q.; Schüpbach, B.; Terfort, A.; Wöll, C. H.: Mobility of charge carriers in self-assembled monolayers. Beilstein Journal of Nanotechnology 10, pp. 2449 - 2458 (2019)

Bashir, A.; Heck, A.; Narita, A.; Feng, X.; Nefedov, A.; Rohwerder, M.; Müllen, K.; Elstner, M.; Wöll, C. H.: Charge carrier mobilities in organic semiconductors: crystal engineering and the importance of molecular contacts. Physical Chemistry Chemical Physics 17 (34), pp. 21988 - 21996 (2015)

Muglali, M. I.; Liu, J.; Bashir, A.; Borissov, D.; Xu, M.; Wang, Y.; Wöll, C. H.; Rohwerder, M.: On the complexation kinetics for metallization of organic layers: Palladium onto a pyridine-terminated araliphatic thiol film. Physical Chemistry Chemical Physics 14 (14), pp. 4703 - 4712 (2012)

Merzlikin, S. V.; Tolkachev, N. N.; Briand, L. E.; Strunskus, T.; Wöll, C. H.; Wachs, I. E.; Grünert, W.: Anomalous surface compositions of stoichiometric mixed oxide compounds. Angewandte Chemie International Edition 49 (43), pp. 8037 - 8041 (2010)

Merzlikin, S. V.; Tolkachev, N. N.; Briand, L. E.; Strunskus, T.; Wöll, C. H.; Wachs, I. E.; Grünert, W.: Anomale Oberflächenzusammensetzung stöchiometrischer Mischoxid-Verbindungen. Angewandte Chemie 122, pp. 8212 - 8216 (2010)

Merzlikin, S. V.; Tolkachev, N. N.; Strunskus, T.; Witte, G.; Glogowski, T.; Wöll, C. H.; Grünert, W.: Reply to a comment of J. Zemek, Prague, regarding the paper "resolving the depth coordinate in photoelectron spectroscopy - comparison of excitation energy variation vs. angular-resolved XPS for the analysis of a self-assembled monolayer model system" Discussion. Surface Science 602 (23), pp. 3634 - 3635 (2008)

Merzlikin, S. V.; Tolkachev, N. N.; Strunskus, T.; Witte, G.; Glogowski, T.; Wöll, C. H.; Grünert, W.: Resolving the depth coordinate in photoelectron spectroscopy – Comparison of excitation energy variation vs. angular-resolved XPS for the analysis of a self-assembled monolayer model system. Surface Science 602 (3), pp. 755 - 767 (2008)

Merzlikin, S. V.; Grünert, W.; Strunskus, T.; Witte, G.; Wachs, I. E.; Wöll, C. H.; Tolkachev, N. N.; Tkachenko, O. P.: Quantitative Tiefenprofilierung durch XPS – Ein neuer Ansatz in der Oberflächenanalyse realer Materialien. 49.Jahrestreffen Deutscher Katalytiker, DECHEMA, 2007, Weimar, Germany (2007)

Merzlikin, S. V.; Grünert, W.; Tolkachev, N. N.; Strunskus, T.; Wöll, C. H.: Further development of depth differentiation X-ray photoelectron spectroscopy (XPS). 39.Jahrestreffen Deutscher Katalytiker, DECHEMA, 2006, Weimar, Germany (2006)

Merzlikin, S. V.; Grünert, W.; Strunskus, T.; Wöll, C. H.: Depth differentiation x-ray photoelectron spectroscopy (XPS). 38.Jahrestreffen Deutscher Katalytiker, DECHEMA, 2005, Weimar, Germany (2005)