Krause, F. F.; Ahl, J.-P.; Tytko, D.; Choi, P.-P.; Egoavil, R.; Schowalter, M.; Mehrtens, T.; Müller-Caspary, K.; Verbeeck, J.; Raabe, D. et al.; Hertkorn, J.; Engl, K.; Rosenauer, A.: Homogeneity and composition of AlInGaN: A multiprobe nanostructure study. Ultramicroscopy 156, pp. 29 - 36 (2015)

Mehrtens, T.; Schowalter, M.; Tytko, D.; Choi, P.-P.; Raabe, D.; Hoffmann, L.; Jönen, H.; Rossow, U.; Hangleiter, A.; Rosenauer, A.: Measurement of the indium concentration in high indium content InGaN layers by scanning transmission electron microscopy and atom probe tomography. Applied Physics Letters 102 (13), 132112 (2013)

Mehrtens, T.; Schowalter, M.; Tytko, D.; Choi, P.-P.; Raabe, D.; Hoffmann, L.; Jönen, H.; Rossow, U.; Hangleiter, A.; Rosenauer, A.: Measuring composition in InGaN from HAADF-STEM images and studying the temperature dependence of Z-contrast. In: Journal of Physics: Conference Series, Vol. 471, 012009. 18th Microscopy of Semiconducting Materials Conference, MSM 2013, Oxford, UK, April 07, 2013 - April 11, 2013. (2013)