Herbig, M.; Choi, P.; Raabe, D.: Atom Probe Tomography and Correlative TEM/APT at the MPIE. Inauguration of the Atom Probe at the Institute for Physics IA at the RWTH Aachen, Aachen, Germany (2014)
Herbig, M.; Raabe, D.; Li, Y.; Choi, P.; Zaefferer, S.; Goto, S.: High Throughput Quantification of Grain Boundary Segregation by Correlative TEM and APT. TMS 2014, Solid-State Interfaces III Symposium, San Diego, CA, USA (2014)
Herbig, M.; Choi, P.-P.; Raabe, D.: Atom Probe Tomography and Correlative TEM/APT at the MPIE. Mini-Symposium Atom Probe Tomography, National APT Facility Eindhoven, TU Delft, Delft, The Netherlands (2014)
Herbig, M.; Raabe, D.; Li, Y.; Choi, P.-P.; Zaefferer, S.; Goto, S.: High Throughput Quantification of Grain Boundary Segregation by Correlative Transmission Electron Microscopy and Atom Probe Tomography. International Conference on Atom Probe Tomography & Microscopy 2014, Stuttgart, Germany (2014)
Choi, P.: Characterization of κ-carbide precipitates in austenitic Fe–Mn–Al–C steels using atom probe tomography. Thermec 2013, Las Vegas, NV, USA (2013)
Herbig, M.; Raabe, D.; Li, Y. J.; Choi, P.; Zaefferer, S.; Goto, S.: Quantification of Grain Boundary Segregation in Nanocrystalline Material. Seminar at Department Microstructure Physics and Alloy Design, MPI für Eisenforschung, Düsseldorf, Germany (2013)
Herbig, M.; Choi, P.; Raabe, D.: Combining Structural and Chemical Information on the nm Scale by Correlative TEM and APT Characterization. European Atom Probe Workshop 2013 at ETH Zürich, Zürich, Switzerland (2013)
Max Planck scientists design a process that merges metal extraction, alloying and processing into one single, eco-friendly step. Their results are now published in the journal Nature.
Atom probe tomography (APT) is a material analysis technique capable of 3D compositional mapping with sub-nanometer resolution. The specimens for APT are shaped as sharp needles (~100 nm radius at the apex), so as to reach the necessary intense electrostatic fields, and are typically prepared via focused ion beam (FIB) based milling.