Diehl, M.; Eisenlohr, P.; Shanthraj, P.; Roters, F.: Using the Spectral Solver. 5th International Symposium on Computational Mechanics of Polycrystals, CMCn 2016 and first DAMASK User Meeting, Düsseldorf, Germany (2016)
Mianroodi, J. R.; Shanthraj, P.; Svendsen, B.: Strongly versus weakly non-local dislocation transport and pile-up. 24th International Congress of Theoretical and Applied Mechanics, Montreal, Canada (2016)
Mianroodi, J. R.; Shanthraj, P.; Svendsen, B.: Comparison of algorithms and solution methods for classic and phase-field-based periodic inhomogeneous elastostatics. ECCOMAS Congress 2016, Crete, Greece (2016)
Roters, F.; Diehl, M.; Shanthraj, P.: Crystal Plasticity Simulations - Fundamentals, Implementation, Application. Micromechanics of Materials, Zernike Institute for Advanced Materials, University of Groningen
, Groningen, The Netherlands (2016)
Roters, F.; Diehl, M.; Shanthraj, P.: DAMASK Evolving From a Crystal Plasticity Subroutine Towards a Multi-Physics Simulation Tool. Focus Group Meeting “Metals”, SPP 1713, Bad Herrenalb, Germany (2016)
Roters, F.; Zhang, C.; Eisenlohr, P.; Shanthraj, P.; Diehl, M.: On the usage of HDF5 in the DAMASK crystal plasticity toolkit. 2nd International Workshop on Software Solutions for Integrated Computational Materials Engineering - ICME 2016, Barcelona, Spain (2016)
Diehl, M.; Eisenlohr, P.; Roters, F.; Shanthraj, P.; Reuber, J. C.; Raabe, D.: DAMASK: The Düsseldorf Advanced Material Simulation Kit for studying crystal plasticity using an FE based or a spectral numerical solver. Seminar of the Centro Nacional de Investigaciones Metalúrgicas (CENIM) del CSIC , Madrid, Spain (2015)
Max Planck scientists design a process that merges metal extraction, alloying and processing into one single, eco-friendly step. Their results are now published in the journal Nature.
Electron channelling contrast imaging (ECCI) is a powerful technique for observation of extended crystal lattice defects (e.g. dislocations, stacking faults) with almost transmission electron microscopy (TEM) like appearance but on bulk samples in the scanning electron microscope (SEM).