Kühbach, M.; Breen, A. J.; Herbig, M.; Gault, B.; Raabe, D.: Building a Library of Simulated Atom Probe Data for Different Crystal Structures and Pillar Orientations Using TAPSim. APT&M 2018 International Conference on Atom-Probe Tomography & Microscopy, Washington, DC, USA (2018)
Makineni, S. K.; Raabe, D.; Gault, B.: Development of high temperature Mo–Si–B based alloy through Laser Additive Manufacturing. Intermetallics 2017, Bad Staffelstein, Germany (2017)
Rusitzka, A. K.; Stephenson, L.; Gremer, L.; Raabe, D.; Willbold, D.; Gault, B.: Getting insights to Alzheimer‘s disease by atom probe tomography. 6th International caesar conference, Overcoming Barriers — atomic-resolution and beyond: advances in molecular electron microscopy, Bonn, Germany (2017)
Kwiatkowski da Silva, A.; Ponge, D.; Inden, G.; Gault, B.; Raabe, D.: Physical Metallurgy of segregation, austenite reversion, carbide precipitation and related phenomena in medium Mn steels. Gordon Research Conference: Physical Metallurgy, Biddeford, ME, USA (2017)
Gault, B.: Graduate course on Atom Probe Tomography, as part of the Centre for Doctoral Training on Materials Charactisation. Lecture: SS 2024, Imperial College London, UK, 2024-04 - 2024-07
Gault, B.: Graduate course on Atom Probe Tomography, as part of the Centre for Doctoral Training on Materials Charactisation. Lecture: SS 2023, Imperial College London, UK, 2023-04 - 2023-07
Gault, B.: Graduate course on Atom Probe Tomography, as part of the Centre for Doctoral Training on Materials Charactisation. Lecture: SS 2022, Imperial College London, UK, 2022-04 - 2022-07
Gault, B.: Graduate course on Atom Probe Tomography, as part of the Centre for Doctoral Training on Materials Charactisation. Lecture: SS 2021, Imperial College London, UK, 2021-04 - 2021-07
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Atom probe tomography (APT) is one of the MPIE’s key experiments for understanding the interplay of chemical composition in very complex microstructures down to the level of individual atoms. In APT, a needle-shaped specimen (tip diameter ≈100nm) is prepared from the material of interest and subjected to a high voltage. Additional voltage or laser…
Ever since the discovery of electricity, chemical reactions occurring at the interface between a solid electrode and an aqueous solution have aroused great scientific interest, not least by the opportunity to influence and control the reactions by applying a voltage across the interface. Our current textbook knowledge is mostly based on mesoscopic…
Recent developments in experimental techniques and computer simulations provided the basis to achieve many of the breakthroughs in understanding materials down to the atomic scale. While extremely powerful, these techniques produce more and more complex data, forcing all departments to develop advanced data management and analysis tools as well as…
Integrated Computational Materials Engineering (ICME) is one of the emerging hot topics in Computational Materials Simulation during the last years. It aims at the integration of simulation tools at different length scales and along the processing chain to predict and optimize final component properties.
Data-rich experiments such as scanning transmission electron microscopy (STEM) provide large amounts of multi-dimensional raw data that encodes, via correlations or hierarchical patterns, much of the underlying materials physics. With modern instrumentation, data generation tends to be faster than human analysis, and the full information content is…
The project’s goal is to synergize experimental phase transformations dynamics, observed via scanning transmission electron microscopy, with phase-field models that will enable us to learn the continuum description of complex material systems directly from experiment.
In order to prepare raw data from scanning transmission electron microscopy for analysis, pattern detection algorithms are developed that allow to identify automatically higher-order feature such as crystalline grains, lattice defects, etc. from atomically resolved measurements.