Publications of Julie Marie Cairney

Dehm, G.; Cairney, J. M.: Implication of grain-boundary structure and chemistry on plasticity and failure. MRS Bulletin 47 (2022)

Gault, B.; Chiaramonti, A. N.; Cojocaru-Mirédin, O.; Stender, P.; Dubosq, R.; Freysoldt, C.; Makineni, S. K.; Li, T.; Moody, M. P.; Cairney, J. M.: Atom probe tomography. Nature reviews: Methods primers 1, 51 (2021)

Exertier, F.; La Fontaine, A.; Corcoran, C.; Piazolo, S.; Belousova, E. A.; Peng, Z.; Gault, B.; Saxey, D. W.; Fougerouse, D.; Reddy, S. M. et al.; Pedrazzini, S.; Bagot, P. A. J.; Moody, M. P.; Langelier, B.; Moser, D. E.; Botton, G. A.; Vogel, F.; Thompson, G. B.; Blanchard, P. T.; Chiaramonti, A. N.; Reinhard, D. A.; Rice, K. P.; Schreiber, D. K.; Kruska, K.; Wang, J.; Cairney, J. M.: Atom probe tomography analysis of the reference zircon gj-1: An interlaboratory study. Chemical Geology 495, pp. 27 - 35 (2018)

Eder, K.; Felfer, P. J.; Gault, B.; Ceguerre, A. V.; La Fontaine, A.; Masters, A. F.; Maschmeyer, T.; Cairney, J. M.: A New Approach to Understand the Adsorption of Thiophene on Different Surfaces: An Atom Probe Investigation of Self-Assembled Monolayers. Langmuir 33 (38), pp. 9573 - 9581 (2017)

Cairney, J. M.; Gault, B.; Larson, D. J.: Recognizing 60 years of achievements in field emission and atomic scale microscopy: Reflections on the International Field Emission Society. Materials Today 19 (4), pp. 182 - 183 (2016)

Aughterson, R. D.; Lumpkin, G. R.; de Los Reyes, M.; Gault, B.; Baldo, P. M.; Ryan, E. A.; Whittle, K. R.; Smith, K. L. W.; Cairney, J. M.: The influence of crystal structure on ion-irradiation tolerance in the Sm_(x)Yb_(2-x)TiO₅ series. Journal of Nuclear Materials 471, pp. 17 - 24 (2016)

Cairney, J. M.; Rajan, K. K.; Haley, D.; Gault, B.; Bagot, P. A. J.; Choi, P.-P.; Felfer, P. J.; Ringer, S. P.; Marceau, R. K. W.; Moody, M. P.: Mining information from atom probe data. Ultramicroscopy 159, pp. 324 - 337 (2015)

Ceguerra, A. V.; Breen, A. J.; Stephenson, L.; Felfer, P. J.; Araullo-Peters, V. J.; Liddicoat, P. V.; Cui, X. Y.; Yao, L.; Haley, D.; Moody, M. P. et al.; Gault, B.; Cairney, J. M.; Ringer, S. P.: The rise of computational techniques in atom probe microscopy. Current Opinion in Solid State and Materials Science 17 (5), pp. 224 - 235 (2013)