Dehm, G.; Inkson, B. J.; Wagner, T. A.: Growth and microstructural stability of epitaxial Al films on (0001) α-Al2O3 substrates. Acta Materialia 50 (20), pp. 5021 - 5032 (2002)
Inkson, B. J.; Dehm, G.; Wagner, T. A.: In-situ TEM observation of dislocation motion in thermally strained Al nanowires. Acta Materialia 50 (20), pp. 5033 - 5047 (2002)
Beschliesser, M.; Chatterjee, A.; Lorich, A.; Knabl, W.; Kestler, H.; Dehm, G.; Clemens, H.: Designed fully lamellar microstructures in a γ-TiAl based alloy: adjustment and microstructural changes upon long-term isothermal exposure at 700 and 800 degrees C. Materials Science and Engineering A-Structural Materials Properties Microstructure and Processing 329-331, pp. 124 - 129 (2002)
Dehm, G.; Balk, T. J.; von Blanckenhagen, B.; Gumbsch, P.; Arzt, E.: Dislocation dynamics in sub-micron confinement: recent progress in Cu thin film plasticity. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques 93 (5), pp. 383 - 391 (2002)
Schillinger, W.; Clemens, H.; Dehm, G.; Bartels, A.: Microstructural stability and creep behavior of a lamellar γ-TiAl based alloy with extremely fine lamellar spacing. Intermetallics 10 (5), pp. 459 - 466 (2002)
Bartels, A.; Clemens, H.; Dehm, G.; Lach, E.; Schillinger, W.: Strain rate dependence of the deformation mechanisms in a fully lamellar γ-TiAl-based alloy. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques 93 (3), pp. 180 - 185 (2002)
Dehm, G.; Wagner, T. A.; Balk, T. J.; Arzt, E.; Inkson, B. J.: Plasticity and interfacial dislocation mechanisms in epitaxial and polycrystalline Al films constrained by substrates. Journal of Materials Science & Technology 18 (2), pp. 113 - 117 (2002)
Kobrinsky, M. J.; Dehm, G.; Thompson, C. L.; Arzt, E.: Effects of thickness on the characteristic length scale of dislocation plasticity in Ag thin films. Acta Materialia 49 (17), pp. 3597 - 3607 (2001)
Dehm, G.; Weiss, D.; Arzt, E.: In situ transmission electron microscopy study of thermal-stress-induced dislocations in a thin Cu film constrained by a Si substrate. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing 309-310, pp. 468 - 472 (2001)
Legros, M.; Dehm, G.; Keller-Flaig, R.-M.; Arzt, E.; Hemker, K. J.; Süresh, S.: Dynamic observation of Al thin films plastically strained in a TEM. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing 309-310, pp. 463 - 467 (2001)
Scheu, C.; Dehm, G.; Kaplan, W. D.: Equilibrium amorphous silicon-calcium-oxygen films at interfaces in copper-alumina composites prepared by melt infiltration. Journal of the American Ceramic Society 84 (3), pp. 623 - 630 (2001)
Zhang, D.; Dehm, G.; Clemens, H.: On the microstructural evolution and phase transformation in a high niobium containing γ-TiAl alloy. Zeitschrift für Metallkunde 91 (11), pp. 950 - 956 (2000)
Chatterjee, A.; Dehm, G.; Scheu, C.; Clemens, H.: Onset of microstructural instability in a fully lamellar Ti-46.5 at.% Al-4 al.% (Cr,Nb,Ta,B) alloy during short-term creep. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques 91 (9), pp. 755 - 760 (2000)
Dehm, G.; Arzt, E.: In-situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate. Applied Physics Letters 77 (8), pp. 1126 - 1128 (2000)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Complex simulation protocols combine distinctly different computer codes and have to run on heterogeneous computer architectures. To enable these complex simulation protocols, the CM department has developed pyiron.
Statistical significance in materials science is a challenge that has been trying to overcome by miniaturization. However, this process is still limited to 4-5 tests per parameter variance, i.e. Size, orientation, grain size, composition, etc. as the process of fabricating pillars and testing has to be done one by one. With this project, we aim to…
Atom probe tomography (APT) provides three dimensional(3D) chemical mapping of materials at sub nanometer spatial resolution. In this project, we develop machine-learning tools to facilitate the microstructure analysis of APT data sets in a well-controlled way.
Atom probe tomography (APT) is one of the MPIE’s key experiments for understanding the interplay of chemical composition in very complex microstructures down to the level of individual atoms. In APT, a needle-shaped specimen (tip diameter ≈100nm) is prepared from the material of interest and subjected to a high voltage. Additional voltage or laser…