Herbig, M.; Raabe, D.; Li, Y.; Choi, P.; Zaefferer, S.; Goto, S.: High Throughput Quantification of Grain Boundary Segregation by Correlative TEM and APT. TMS 2014, Solid-State Interfaces III Symposium, San Diego, CA, USA (2014)
Herbig, M.; Raabe, D.; Li, Y.; Choi, P.-P.; Zaefferer, S.; Goto, S.: High Throughput Quantification of Grain Boundary Segregation by Correlative Transmission Electron Microscopy and Atom Probe Tomography. International Conference on Atom Probe Tomography & Microscopy 2014, Stuttgart, Germany (2014)
Konijnenberg, P. J.; Stechmann, G.; Zaefferer, S.; Raabe, D.: Advances in Analysis of 3D Orientation Data Sets Obtained by FIB-EBSD Tomography. 2nd International Congress on 3D Materials Science 2014, Annecy, France (2014)
Ram, F.; Khorashadizadeh, A.; Zaefferer, S.: Kikuchi Band Sharpness: A Measure for the Density of the Crystal Lattice Defects. MSE 2014, Darmstadt, Germany (2014)
Ram, F.; Zaefferer, S.: Accurate Kikuchi band localization and its application for diffraction geometry determination. HR-EBSD workshop, Imperial College, London, UK (2014)
Ram, F.; Zaefferer, S.: Plastic strain derivation and Kikuchi band localization by applying the Kikuchi bandlet method to electron backscatter Kikuchi Diffraction patterns. 17th ICOTOM, Dresden; Germany (2014)
Zaefferer, S.: SEM and TEM based orientation microscopy for investigation of recrystallization processes. CNRS summer school on recrystallization, Frejus, France (2014)
Herbig, M.; Raabe, D.; Li, Y. J.; Choi, P.; Zaefferer, S.; Goto, S.: Quantification of Grain Boundary Segregation in Nanocrystalline Material. Seminar at Department Microstructure Physics and Alloy Design, MPI für Eisenforschung, Düsseldorf, Germany (2013)
Zaefferer, S.; Elhami, N. N.: Electron Channelling Contrast Imaging under controlled diffraction conditions, cECCI - Theory and Applications. CEMEF, Sofia-Antipolis, France (2013)
Zaefferer, S.; Kleindiek, S.; Schock, K.; Volbert, B.: Combined Application of EBSD and ECCI Using a Versatile 5-Axes Goniometer in an SEM. Microscopy and Microanalysis 2013, Indianapolis, IN, USA (2013)
Zaefferer, S.; Elhami, N. N.; Konijnenberg, P. J.; Jäpel, T.: Quantitative Microstructure Characterization by Application of Advanced SEM-Based Electron Diffraction Techniques. Microscopy and Microanalysis 2013, Indianapolis, IN, USA (2013)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Statistical significance in materials science is a challenge that has been trying to overcome by miniaturization. However, this process is still limited to 4-5 tests per parameter variance, i.e. Size, orientation, grain size, composition, etc. as the process of fabricating pillars and testing has to be done one by one. With this project, we aim to…
Atom probe tomography (APT) provides three dimensional(3D) chemical mapping of materials at sub nanometer spatial resolution. In this project, we develop machine-learning tools to facilitate the microstructure analysis of APT data sets in a well-controlled way.
Atom probe tomography (APT) is one of the MPIE’s key experiments for understanding the interplay of chemical composition in very complex microstructures down to the level of individual atoms. In APT, a needle-shaped specimen (tip diameter ≈100nm) is prepared from the material of interest and subjected to a high voltage. Additional voltage or laser…
Ever since the discovery of electricity, chemical reactions occurring at the interface between a solid electrode and an aqueous solution have aroused great scientific interest, not least by the opportunity to influence and control the reactions by applying a voltage across the interface. Our current textbook knowledge is mostly based on mesoscopic…