Publications of Jochen Schneider

Zhou, X.; Mathews, P.; Berkels, B.; Delis, W.; Saood, S.; Shamseldeen Ali Alhassan, A.; Keuter, P.; Schneider, J.; Korte-Kerzel, S.; Sandlöbes-Haut, S. et al.; Raabe, D.; Neugebauer, J.; Dehm, G.; Hickel, T.; Scheu, C.; Zhang, S.: Materials Design by Constructing Phase Diagrams for Defects. Advanced Materials 37 (3), 2402191 (2025)

Kanjilal, A.; Aliramaji, S.; Neuß, D.; Hans, M.; Schneider, J. M.; Best, J. P.; Dehm, G.: Microscale deformation of an intermetallic-metal interface in bi-layered film under shear loading. Scripta Materialia 263, 116665 (2025)

Pöllmann, P. J.; Bogdanovski, D.; Lellig, S.; Schweizer, P.; Hans, M.; Azina, C.; Karimi Aghda, S.; Zöll, P.; Holzapfel, D. M.; Primetzhofer, D. et al.; Kolozsvári, S.; Polcik, P.; Michler, J.; Schneider, J. M.: Metastable phase formation of (Mo,Cr)₂AlB₂ MAB phase thin films revealed by theory and experiments. Materials Research Letters 12 (1), pp. 58 - 66 (2024)

Gopalan, H.; Marshal, A.; Hans, M.; Primetzhofer, D.; Cautaerts, N.; Breitbach, B.; Völker, B.; Kirchlechner, C.; Schneider, J. M.; Dehm, G.: On the interplay between microstructure, residual stress and fracture toughness of (Hf–Nb–Ta–Zr)C multi-metal carbide hard coatings. Materials and Design 224, 111323 (2022)

Devulapalli, V.; Hans, M.; Prithiv, T. S.; Schneider, J. M.; Dehm, G.; Liebscher, C.: Microstructure, grain boundary evolution and anisotropic Fe segregation in (0001) textured Ti thin films. Acta Materialia 238, 118180 (2022)

Bishara, H.; Kontis, P.; Dehm, G.; Schneider, J. M.; Evertz, S.: Effect of hybridization in PdAlY-(Ni/Au/Ir) metallic glasses thin films on electrical resistivity. Scripta Materialia 214, 114681 (2022)

Bogdanovski, D.; Poellmann, P. J.; Schneider, J. M.: An ab initio investigation of the temperature-dependent energetic barriers towards CrAlB and (Mo,Cr)AlB formation in a metastable synthesis scenario. Nanoscale 14, pp. 12866 - 12874 (2022)

Zhang, S.; Xie, Z.; Keuter, P.; Ahmad, S.; Abdellaoui, L.; Zhou, X.; Cautaerts, N.; Breitbach, B.; Aliramaji, S.; Korte-Kerzel, S. et al.; Hans, M.; Schneider, J. M.; Scheu, C.: Atomistic structures of〈0001〉tilt grain boundaries in a textured Mg thin film. Nanoscale 14 (48), pp. 18192 - 18199 (2022)

Völker, B.; Stelzer, B.; Mráz, S.; Rueß, H.; Sahu, R.; Kirchlechner, C.; Dehm, G.; Schneider, J. M.: On the fracture behavior of Cr₂AlC coatings. Materials and Design 206, 109757 (2021)

Evertz, S.; Schnabel, V.; Köhler, M.; Kirchlechner, I.; Kontis, P.; Chen, Y.-T.; Soler, R.; Jaya, B. N.; Kirchlechner, C.; Mušić, D. et al.; Gault, B.; Gault, B.; Schneider, J. M.; Raabe, D.; Dehm, G.: Review on Quantum Mechanically Guided Design of Ultra-Strong Metallic Glasses. Frontiers in Materials 7, 89 (2020)

Evertz, S.; Kirchlechner, I.; Soler, R.; Kirchlechner, C.; Kontis, P.; Bednarcik, J.; Gault, B.; Dehm, G.; Raabe, D.; Schneider, J. M.: Electronic structure based design of thin film metallic glasses with superior fracture toughness. Materials and Design 186, 108327 (2020)

Stelzer, B.; Chen, X.; Bliem, P.; Hans, M.; Völker, B.; Sahu, R.; Scheu, C.; Primetzhofer, D.; Schneider, J. M.: Remote Tracking of Phase Changes in Cr₂AlC Thin Films by In-situ Resistivity Measurements. Scientific Reports 9, 8266 (2019)

Hans, M.; Patterer, L.; Mušić, D.; Holzapfel, D. M.; Evertz, S.; Schnabel, V.; Stelzer, B.; Primetzhofer, D.; Völker, B.; Widrig, B. et al.; Eriksson, A. O.; Ramm, J.; Arndt, M.; Rudigier, H.; Schneider, J. M.: Stress-dependent elasticity of TiAlN coatings. Coatings 9 (1), 24 (2019)

Gleich, S.; Soler, R.; Fager, H.; Bolvardi, H.; Achenbach, J.-O.; Hans, M.; Primetzhofer, D.; Schneider, J. M.; Dehm, G.; Scheu, C.: Modifying the nanostructure and the mechanical properties of Mo₂BC hard coatings: Influence of substrate temperature during magnetron sputtering. Materials and Design 142, pp. 203 - 211 (2018)

Schnabel, V.; Jaya, B. N.; Köhler, M.; Mušić, D.; Kirchlechner, C.; Dehm, G.; Raabe, D.; Schneider, J. M.: Electronic hybridisation implications for the damage-tolerance of thin film metallic glasses. Scientific Reports 6, 36556 , pp. 1 - 12 (2016)

Zhou, X.; Mathews, P.; Berkels, B.; Ahmad, S.; Alhassan, A. S. A.; Keuter, P.; Schneider, J. M.; Raabe, D.; Neugebauer, J.; Dehm, G. et al.; Hickel, T.; Scheu, C.; Zhang, S.: Constructing phase diagrams for defects by correlated atomic-scale characterization. arXiv (2023)