Dehm, G.: Shedding light on the role of interfaces for strengthening materials by using micromechanical testing. 60. Metallkunde-Jubiläumskolloquium, Lech am Arlberg, Germany (2014)
Dehm, G.: Cu–Cr nanocomposites and multilayers. Gordon Research Conference: Thin Film & Small Scale Mechanical Behavior, Bentley University, Boston, MA, USA (2014)
Dehm, G.: Localized mechanical study of individual interfaces in miniaturized Cu structures. MS&T14 - Materials Science & Technology 2014, Pittsburgh, PA, USA (2014)
Imrich, P. J.; Kirchlechner, C.; Motz, C.; Jeon, J. B.; Dehm, G.: In Situ Electron Microscopy and Micro-Laue Study of Plasticity in Miniaturized Cu Bicrystals. CAMTEC III, Symposium on Fine-Scale Mechanical Characterisation and Behaviour , Cambridge, UK (2014)
Kirchlechner, C.; Imrich, P. J.; Motz, C.; Dehm, G.: Plastic deformation of bi-crystalline micro pillars analyzed by in situ µLaue diffraction. TMS2014, Annual Meeting & Exhibition, San Diego, CA, USA (2014)
Pizzagalli, L.; Dehm, G.; Thomas, O.: Structure and dynamics V: Mechanical properties at small scales. Condensed Matter in Paris: Mini-colloquium 32, Paris, France (2014)
Dehm, G.: From idealized bi-crystals towards applied polycrystals: Plastic deformation in small dimensions. 2013 MRS Fall Meeting, Boston, MA, USA (2013)
Dehm, G.: Structure and Micromechanics of Materials. Materialwissenschaftliches Kolloquium ICAMS und Institut für Werkstoffe, RUB, Bochum, Germany (2013)
Dehm, G.: Probing deformation phenomena at small length scales. ECI on Nanomechanical Testing in Materials Research and Development IV, Olhão, Portugal (2013)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Here, we aim to develop machine-learning enhanced atom probe tomography approaches to reveal chemical short/long-range order (S/LRO) in a series of metallic materials.
ECCI is an imaging technique in scanning electron microscopy based on electron channelling applying a backscatter electron detector. It is used for direct observation of lattice defects, for example dislocations or stacking faults, close to the surface of bulk samples.
It is very challenging to simulate electron-transfer reactions under potential control within high-level electronic structure theory, e. g. to study electrochemical and electrocatalytic reaction mechanisms. We develop a novel method to sample the canonical NVTΦ or NpTΦ ensemble at constant electrode potential in ab initio molecular dynamics…
Electron microscopes offer unique capabilities to probe materials with extremely high spatial resolution. Recent advancements in in situ platforms and electron detectors have opened novel pathways to explore local properties and the dynamic behaviour of materials.