
Publications of François Vurpillot
All genres
Journal Article (13)
1.
Journal Article
203, 114036 (2021)
Revealing atomic-scale vacancy-solute interaction in nickel. Scripta Materialia 2.
Journal Article
205, 114213 (2021)
Corrigendum to Revealing atomic-scale vacancy-solute interaction in nickel (Scripta Materialia (2021) 203, (114036) (S135964622100316X), (10.1016/j.scriptamat.2021.114036)). Scripta Materialia 3.
Journal Article
260, 107317 (2021)
A model to predict image formation in the three-dimensional field ion microscope. Computer Physics Communications 4.
Journal Article
Reflections on the Spatial Performance of Atom Probe Tomography in the Analysis of Atomic Neighborhoods. Microscopy and Microanalysis, pp. 1 - 11 (2021)
5.
Journal Article
Analytical Three-Dimensional Field Ion Microscopy of an Amorphous Glass FeBSi. Microscopy and Microanalysis, pp. 1 - 9 (2021)
6.
Journal Article
26 (6), pp. 1133 - 1146 (2020)
Dynamic Effects in Voltage Pulsed Atom Probe. Microscopy and Microanalysis 7.
Journal Article
218, 113092 (2020)
Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations. Ultramicroscopy 8.
Journal Article
11, 1022 (2020)
Interpreting nanovoids in atom probe tomography data for accurate local compositional measurements. Nature Communications 9.
Journal Article
21 (12), 123020 (2019)
Imaging individual solute atoms at crystalline imperfections in metals. New Journal of Physics 10.
Journal Article
10 (3), pp. 581 - 588 (2019)
Unraveling the Metastability of Cn2+ (n = 2-4) Clusters. The Journal of Physical Chemistry Letters 11.
Journal Article
25 (2), pp. 389 - 400 (2019)
An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography. Microscopy and Microanalysis 12.
Journal Article
189, pp. 54 - 60 (2018)
On the detection of multiple events in atom probe tomography. Ultramicroscopy 13.
Journal Article
51 (10), 105601, pp. 1 - 10 (2018)
Impact of local electrostatic field rearrangement on field ionization. Journal of Physics D: Applied Physics Conference Paper (1)
14.
Conference Paper
23, pp. 644 - 645. Microscopy & Microanalysis 2017, St. Louis, Missouri, USA, August 06, 2017 - August 10, 2017. (2017)
Atomistic Simulations of Surface Effects Under High Electric Fields. In: Proceedings of Microscopy & Microanalysis 2017, Vol. Talk (3)
15.
Talk
An automated computational approach for extraction in-plane compositional information of interface in atom probe tomography dataset. APT&M 2018 conference, Gaitherburg, MD, USA (2018)
16.
Talk
Reconstructing field ion microscopy and atom probe data. Australian Atom Probe Workshop, Magnetic Island, Australia (2017)
17.
Talk
Revisiting Field Ion Microscopy. TMS 2017, San Diego, CA, USA (2017)