Publications of François Vurpillot

Morgado, F. F.; Katnagallu, S.; Freysoldt, C.; Klaes, B.; Vurpillot, F.; Neugebauer, J.; Raabe, D.; Neumeier, S.; Gault, B.; Stephenson, L.: Revealing atomic-scale vacancy-solute interaction in nickel. Scripta Materialia 203, 114036 (2021)

Morgado, F. F.; Katnagallu, S.; Freysoldt, C.; Klaes, B.; Vurpillot, F.; Neugebauer, J.; Raabe, D.; Neumeier, S.; Gault, B.; Stephenson, L.: Corrigendum to Revealing atomic-scale vacancy-solute interaction in nickel (Scripta Materialia (2021) 203, (114036) (S135964622100316X), (10.1016/j.scriptamat.2021.114036)). Scripta Materialia 205, 114213 (2021)

Klaes, B.; Lardé, R.; Delaroche, F.; Parviainen, S.; Rolland, N.; Katnagallu, S.; Gault, B.; Vurpillot, F.: A model to predict image formation in the three-dimensional field ion microscope. Computer Physics Communications 260, 107317 (2021)

Gault, B.; Klaes, B.; Morgado, F. F.; Freysoldt, C.; Li, Y.; De Geuser, F.; Stephenson, L.; Vurpillot, F.: Reflections on the Spatial Performance of Atom Probe Tomography in the Analysis of Atomic Neighborhoods. Microscopy and Microanalysis, pp. 1 - 11 (2021)

Klaes, B.; Renaux, J.; Lardé, R.; Delaroche, F.; Morgado, F. F.; Stephenson, L.; Gault, B.; Vurpillot, F.: Analytical Three-Dimensional Field Ion Microscopy of an Amorphous Glass FeBSi. Microscopy and Microanalysis, pp. 1 - 9 (2021)

Rousseau, L.; Normand, A.; Morgado, F. F.; Stephenson, L.; Gault, B.; Tehrani, K.; Vurpillot, F.: Dynamic Effects in Voltage Pulsed Atom Probe. Microscopy and Microanalysis 26 (6), pp. 1133 - 1146 (2020)

Dubosq, R.; Gault, B.; Hatzoglou, C.; Schweinar, K.; Vurpillot, F.; Rogowitz, A.; Rantitsch, G.; Schneider, D.: Analysis of nanoscale fluid inclusions in geomaterials by atom probe tomography: Experiments and numerical simulations. Ultramicroscopy 218, 113092 (2020)

Wang, X.; Hatzoglou, C.; Sneed, B.; Fan, Z.; Guo, W.; Jin, K.; Chen, D.; Bei, H.; Wang, Y.; Weber, W. J. et al.; Zhang, Y.; Gault, B.; More, K. L.; Vurpillot, F.; Poplawsky, J. D.: Interpreting nanovoids in atom probe tomography data for accurate local compositional measurements. Nature Communications 11, 1022 (2020)

Katnagallu, S.; Stephenson, L.; Mouton, I.; Freysoldt, C.; Subramanyam, A. P. A.; Jenke, J.; Ladines, A. N. C.; Neumeier, S.; Hammerschmidt, T.; Drautz, R. et al.; Neugebauer, J.; Vurpillot, F.; Raabe, D.; Gault, B.: Imaging individual solute atoms at crystalline imperfections in metals. New Journal of Physics 21 (12), 123020 (2019)

Peng, Z.; Zanuttini, D.; Gervais, B.; Jacquet, E.; Blum, I.; Choi, P.-P.; Raabe, D.; Vurpillot, F.; Gault, B.: Unraveling the Metastability of C_n²⁺ (n = 2-4) Clusters. The Journal of Physical Chemistry Letters 10 (3), pp. 581 - 588 (2019)

Peng, Z.; Lu, Y.; Hatzoglou, C.; Kwiatkowski da Silva, A.; Vurpillot, F.; Ponge, D.; Raabe, D.; Gault, B.: An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography. Microscopy and Microanalysis 25 (2), pp. 389 - 400 (2019)

Peng, Z.; Vurpillot, F.; Choi, P.-P.; Li, Y.; Raabe, D.; Gault, B.: On the detection of multiple events in atom probe tomography. Ultramicroscopy 189, pp. 54 - 60 (2018)

Katnagallu, S.; Dagan, M.; Parviainen, S.; Nematollahi, G. A.; Grabowski, B.; Bagot, P. A. J.; Rolland, N.; Neugebauer, J.; Raabe, D.; Vurpillot, F. et al.; Moody, M. P.; Gault, B.: Impact of local electrostatic field rearrangement on field ionization. Journal of Physics D: Applied Physics 51 (10), 105601, pp. 1 - 10 (2018)

Parviainen, S.; Dagan, M.; Katnagallu, S.; Gault, B.; Moody, M. P.; Vurpillot, F.: Atomistic Simulations of Surface Effects Under High Electric Fields. In: Proceedings of Microscopy & Microanalysis 2017, Vol. 23, pp. 644 - 645. Microscopy & Microanalysis 2017, St. Louis, Missouri, USA, August 06, 2017 - August 10, 2017. (2017)

Peng, Z.; Lu, Y.; Hatzoglou, C.; Kwiatkowski da Silva, A.; Vurpillot, F.; Ponge, D.; Raabe, D.; Gault, B.: An automated computational approach for extraction in-plane compositional information of interface in atom probe tomography dataset. APT&M 2018 conference, Gaitherburg, MD, USA (2018)

Gault, B.; De Geuser, F.; Katnagallu, S.; Nematollahi, G. A.; Dagan, M.; Parviainen, S.; Rusitzka, A. K.; Johnson, E.; Sundell, G.; Andersson, M. et al.; Stephenson, L.; Neugebauer, J.; Moody, M. P.; Vurpillot, F.; Raabe, D.: Reconstructing field ion microscopy and atom probe data. Australian Atom Probe Workshop, Magnetic Island, Australia (2017)

Gault, B.; Dagan, M.; Katnagallu, S.; De Geuser, F.; Vurpillot, F.; Raabe, D.; Moody, M. P.: Revisiting Field Ion Microscopy. TMS 2017, San Diego, CA, USA (2017)