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Conference Paper (1)

Conference Paper
Peng, Z.; Meiners, T.; Gault, B.; Liebscher, C.; Raabe, D.; Lu, Y.: A Methodology for Investigation of Grain-Boundary Diffusion and Segregation. In: MicroscopyMicroanalysis, Vol. 23, pp. 656 - 657. Microscopy & Microanalysis 2017, St. Louis, MO, USA, August 06, 2017 - August 10, 2017. (2017)

Talk (1)

Peng, Z.; Lu, Y.; Hatzoglou, C.; Kwiatkowski da Silva, A.; Vurpillot, F.; Ponge, D.; Raabe, D.; Gault, B.: An automated computational approach for extraction in-plane compositional information of interface in atom probe tomography dataset. APT&M 2018 conference, Gaitherburg, MD, USA (2018)

Poster (1)

Peng, Z.; Meiners, T.; Lu, Y.; Gault, B.; Kostka, A.; Liebscher, C.; Raabe, D.: Methodology for High Resolution Direct Study of Grain Boundary Diffusion, Segregation and Precipitation. Microscopy and Microanalysis 2017 Conference, St. Louis, MO, USA (2017)
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