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Journal Article (1)

  1. 1.
    Journal Article
    Mehrtens, T.; Schowalter, M.; Tytko, D.; Choi, P.-P.; Raabe, D.; Hoffmann, L.; Jönen, H.; Rossow, U.; Hangleiter, A.; Rosenauer, A.: Measurement of the indium concentration in high indium content InGaN layers by scanning transmission electron microscopy and atom probe tomography. Applied Physics Letters 102 (13), 132112 (2013)

Conference Paper (1)

  1. 2.
    Conference Paper
    Mehrtens, T.; Schowalter, M.; Tytko, D.; Choi, P.-P.; Raabe, D.; Hoffmann, L.; Jönen, H.; Rossow, U.; Hangleiter, A.; Rosenauer, A.: Measuring composition in InGaN from HAADF-STEM images and studying the temperature dependence of Z-contrast. In: Journal of Physics: Conference Series, Vol. 471. 18th Microscopy of Semiconducting Materials Conference, MSM 2013, Oxford, UK, April 07, 2013 - April 11, 2013. (2013)
 
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