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Journal Article (5)

  1. 1.
    Journal Article
    Gamsjäger, E.; Liu, Y.; Rester, M.; Puschnig, P.; Draxl, C.; Clemens, H. J.; Dehm, G.; Fischer, F. D.: Diffusive and massive phase transformations in Ti–Al–Nb alloys-Modelling and experiments. Intermetallics 38, pp. 126 - 138 (2013)
  2. 2.
    Journal Article
    Yang, B.; Motz, C.; Rester, M.; Dehm, G.: Yield stress influenced by the ratio of wire diameter to grain size – a competition between the effects of specimen microstructure and dimension in micro-sized polycrystalline copper wires. Philosophical Magazine Letters; Nano-mechanical testing in materials research and development III 92 (25-27), pp. 3243 - 3256 (2012)
  3. 3.
    Journal Article
    Rester, M.; Fischer, F. D.; Kirchlechner, C.; Schmoelzer, T.; Clemens, H. J.; Dehm, G.: Deformation mechanisms in micron-sized PST TiAl compression samples: Experiment and model. Acta Materialia 59 (9), pp. 3410 - 3421 (2011)
  4. 4.
    Journal Article
    Kiener, D.; Rester, M.; Scheriau, S.; Yang, B.; Pippan, R.; Dehm, G.: Influence of external and internal length scale on the flow stress of copper. International Journal of Materials Research 98 (11), pp. 1047 - 1053 (2007)
  5. 5.
    Journal Article
    Kiener, D.; Motz, C.; Rester, M.; Jenko, M.; Dehm, G.: FIB damage of Cu and possible consequences for miniaturized mechanical tests. Materials Science and Engineering A: Structural Materials Properties Microstructure and Processing 459 (1-2), pp. 262 - 272 (2007)

Conference Paper (2)

  1. 6.
    Conference Paper
    Rester, M.; Cha, L.; Scheu, C.; Dehm, G.; Clemens, H. J.; Kothleitner, G.; Leisch, M.: Microstructure of a massively transformed high Nb containing γ-TiAl based alloy. In: 9th Multinational Microscopy Conference 2009, pp. 231 - 232 (Eds. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, August 30, 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)
  2. 7.
    Conference Paper
    Kiener, D.; Jörg, T.; Rester, M.; Motz, C.; Dehm, G.: Conventional TEM Investigation of the FIB Damage in Copper. In: Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, pp. 100 - 101. 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, Saarbrücken, Germany, September 02, 2007 - September 07, 2007. (2007)

Poster (1)

  1. 8.
    Poster
    Rester, M.; Kiener, D.; Kreuzer, H. G.M.; Dehm, G.; Motz, C.: Microstructural investigation of the deformation zone below nanoindents in copper, silver and nickel. Hysitron Workshop and Usermeeting, München, Germany (2006)
 
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