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Journal Article (5)

1.
Journal Article
Salgin, B.; Hamou, F. R.; Rohwerder, M.: Monitoring surface ion mobility on aluminum oxide: Effect of chemical pretreatments. Electrochimica Acta 110, pp. 526 - 533 (2013)
2.
Journal Article
Nesselberger, M.; Roefzaad, M.; Hamou, F. R.; Biedermann, P. U.; Schweinberger, F. F.; Kunz, S.; Schloegl, K.; Wiberg, G. K. H.; Ashton, S.; Heiz, U. et al.; Mayrhofer, K. J. J.; Arenz, M.: The effect of particle proximity on the oxygen reduction rate of size-selected platinum clusters. Nature Materials 12 (10), pp. 919 - 924 (2013)
3.
Journal Article
Hamou, F. R.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical analysis of Debye screening effect in electrode surface potential mapping by scanning electrochemical potential microscopy. Electrochemistry Communucations 12 (10), pp. 1391 - 1394 (2010)
4.
Journal Article
Hamou, F. R.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy. Electrochimica Acta 55 (18), pp. 5210 - 5222 (2010)
5.
Journal Article
Hamou, R. F.; Macdonald, J. R.; Tuncer, E.: Dispersive dielectric and conductive effects in 2D resistor-capacitor networks. Journal of Physics-Condensed Matter 21 (2), 025904 (13pp) (2009)

Talk (8)

6.
Talk
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical Investigation of Electrode Surface Potential Mapping with Scanning Electrochemical Potential Microscopy. The 12th International Scanning Probe Microscopy Conference, Sapporo, Japan (2010)
7.
Talk
Bashir, A.; Muglali, M. I.; Hamou, R. F.; Rohwerder, M.: SECPM Study: Influence of the Tip Material and Its Coating on the Accuracy of Potential Profiling Across Electrical Double Layer at Solid/Liquid Interface. 217th ECS Meeting, Vancouver, Canada (2010)
8.
Talk
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical simulation of probing the electric double layer by scanning electrochemical Potential microscopy. 217th ECS Meeting, Vancouver, Canada (2010)
9.
Talk
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Numerical simulation of probing the electric double layer by scanning electrochemical potential microscopy. International Workshops on Surface Modification for Chemical and Biochemical Sensing, Przegorzaly, Poland (2009)
10.
Talk
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Screening effects in probing the double layer by scanning electrochemical potential microscopy. Comsol European Conference October 2009, Milan, Italy (2009)
11.
Talk
Hamou, R. F.; Biedermann, P. U.; Erbe, A.; Rohwerder, M.: Simulation of probing the electric double layer by scanning electrochemical potential microscopy (SECPM). 11th International Fischer Symposium on Microscopy in Electrochemistry, Benediktbeuern, Germany (2009)
12.
Talk
Hamou, R. F.; Biedermann, P. U.; Rohwerder, M.; Blumenau, A. T.: FEM Simulation of the Scanning Electrochemical Potential Microscopy (SECPM). Comsol European Conference 2008, Hannover, Germany (2008)
13.
Talk
Hamou, R. F.; Biedermann, P. U.; Blumenau, A. T.: FEM Simulation of the Scanning Electrochemical Potential Microscopy (SECPM). SurMat Seminar, Schloß Gnadenthal, Kleve, Germany (2008)

Poster (2)

14.
Poster
Hamou, R. F.; Erbe, A.; Rohwerder, M.: Screening effects in probing the double layer by scanning electrochemical potential microscopy. Comsol European Conference October 2009, Milan, Italy (2009)
15.
Poster
Hamou, R. F.; Biedermann, P. U.; Rohwerder, M.; Blumenau, A. T.: FEM Simulation of the Scanning Electrochemical Potential Microscopy (SECPM). 2nd IMPRS-SurMat Workshop in Surface and Interface Engineering in Advanced Materials, Ruhr-Universität Bochum, Bochum, Germany (2008)

Thesis - PhD (1)

16.
Thesis - PhD
Hamou, F. R.: Numerical Investigation of Scanning Electrochemical Potential Microscopy (SECPM). Dissertation, Fakultät für Physik und Astronomie der Ruhr-Universität, Bochum, Germany (2010)
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