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Talk (2)

  1. 1.
    Talk
    Frank, A.; Dias, M.; Hieke, S. W.; Kruth, A.; Scheu, C.: Electron microscopic investigation of the influence of plasma parameters on VOx films deposited by a plasma ion assisted process. E-MRS 2019 Spring Meeting, Nice, France (2019)
  2. 2.
    Talk
    Frank, A.; Hieke, S. W.; Dias, M.; Fleischmann, S.; Presser, V.; Kruth, A.; Scheu, C.: Transmission electron microscopy study of carbon/metal oxide hybrid materials for Energy Storage Application. 19th International Microscopy Congress IMC19, Sydney, Australia (2018)

Poster (2)

  1. 3.
    Poster
    Frank, A.; Dias, M.; Bodnar, W.; Rojas Nunez, C.; Hieke, S. W.; Husmann, S.; Tolosa, A.; Fleischmann, S.; Presser, V.; Kruth, A. et al.; Scheu, C.: Insights in carbon metal-oxide/sulfide nanohybrid materials by electron microscopy. IAMNano 2019, Düsseldorf, Germany (2019)
  2. 4.
    Poster
    Frank, A.; Dias, M.; Peglow, S.; Bodnar, W.; Kruth, A.; Scheu, C.: Nanohybrid materials and thin films for battery applications. Microscopy Conference, Berlin, Germany (2019)
 
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