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Gault, B.; Larson, D. J.: Atom probe tomography: Looking forward. Scripta Materialia 148, pp. 73 - 74 (2018)

Cairney, J. M.; Gault, B.; Larson, D. J.: Recognizing 60 years of achievements in field emission and atomic scale microscopy: Reflections on the International Field Emission Society. Materials Today 19 (4), pp. 182 - 183 (2016)