Search results

Journal Article (3)

Journal Article
Wei, Y.; Varanasi, R. S.; Schwarz, T.; Gomell, L.; Zhao, H.; Larson, D. J.; Sun, B.; Liu, G.; Chen, H.; Raabe, D. et al.; Gault, B.: Machine-learning-enhanced time-of-flight mass spectrometry analysis. Patterns 2 (2), 100192 (2021)
Journal Article
Gault, B.; Larson, D. J.: Atom probe tomography: Looking forward. Scripta Materialia 148, pp. 73 - 74 (2018)
Journal Article
Cairney, J. M.; Gault, B.; Larson, D. J.: Recognizing 60 years of achievements in field emission and atomic scale microscopy: Reflections on the International Field Emission Society. Materials Today 19 (4), pp. 182 - 183 (2016)
Go to Editor View