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Journal Article (4)

  1. 1.
    Journal Article
    Ram, F.; Li, Z.; Zaefferer, S.; Haghighat, S. M. H.; Zhu, Z.; Raabe, D.; Reed, R.: On the origin of creep dislocations in a Ni-base, single-crystal superalloy: an ECCI, EBSD, and dislocation dynamics-based study. Acta Materialia 109, pp. 151 - 161 (2016)
  2. 2.
    Journal Article
    Ram, F.; Zaefferer, S.; Jäpel, T.; Raabe, D.: Error analysis of the crystal orientations and disorientations obtained by the classical electron backscatter diffraction technique. Journal of Applied Crystallography 48 (3), pp. 797 - 813 (2015)
  3. 3.
    Journal Article
    Griffiths, T. A.; Habler, G.; Rhede, D.; Wirth, R.; Ram, F.; Abart, R.: Localization of submicron inclusion re-equilibration at healed fractures in host garnet. Contributions to Mineralogy and Petrology 168 (6), pp. 1 - 21 (2014)
  4. 4.
    Journal Article
    Ram, F.; Zaefferer, S.; Raabe, D.: Kikuchi bandlet method for the accurate deconvolution and localization of Kikuchi bands in Kikuchi diffraction patterns. Journal of Applied Crystallography 47, pp. 264 - 275 (2014)

Conference Paper (1)

  1. 5.
    Conference Paper
    Ram, F.; Zaefferer, S.: Kikuchi bandlet method: A method for accurate Kikuchi band intensity analysis in EBSD patterns. In: emc2012 proceedings (CD-ROM). EMC 2012 - The 15th European Microscopy Congress, Manchester, UK, September 16, 2012 - September 21, 2012. (2012)

Talk (13)

  1. 6.
    Zaefferer, S.; Schemmann, L.; Stechmann, G.; Ram, F.; Archie, F. M. F.: Using orientation microscopy to explore the correlation of materials properties and microstructures. 25th International conference on materials and technology, Portorož, Slovenia (2017)
  2. 7.
    Zaefferer, S.; Ram, F.; Mandal, S.; Raabe, D.: Dislocations, grain boundaries and strain fields observed on bulk samples: high resolution defect analysis by scanning electron microscopy-based diffraction techniques. ICOTOM 17; invited plenary, Dresden, Germany (2015)
  3. 8.
    Li, Z.; Ram, F.; Zaefferer, S.; Raabe, D.; Reed, R.: Investigations of dislocation structures in a Ni-based single crystal superalloy using Electron Channeling Contrast Imaging (ECCI) and cross-correlation EBSD. RMS EBSD, Glasgow, Scotland, UK (2015)
  4. 9.
    Ram, F.; Zaefferer, S.: Accurate Kikuchi band localization and its application for diffraction geometry determination. HR-EBSD workshop, Imperial College, London, UK (2014)
  5. 10.
    Ram, F.; Zaefferer, S.: Plastic strain derivation and Kikuchi band localization by applying the Kikuchi bandlet method to electron backscatter Kikuchi Diffraction patterns. 17th ICOTOM, Dresden; Germany (2014)
  6. 11.
    Ram, F.: Have we resorted to red herrings to justify our hasty generalizations in materials science? PhD Science Slam, VISIONS IN SCIENCE, Berlin, Germany (2014)
  7. 12.
    Ram, F.; Khorashadizadeh, A.; Zaefferer, S.: Kikuchi Band Sharpness: A Measure for the Density of the Crystal Lattice Defects. MSE 2014, Darmstadt, Germany (2014)
  8. 13.
    Zaefferer, S.; Ram, F.: The Kikuchi bandlet method: Application to plastic and elastic strain measurements. MSA EBSD 2014, Pittsburgh, USA (2014)
  9. 14.
    Zaefferer, S.; Konijnenberg, P.; Ram, F.; Raabe, D.: Observation of geometrically necessary dislocation arrangements at individual grain boundaries deformed in constraint micro bending tests. GDRi CNRS MECANO General Meeting on the Mechanics of Nano-Objects, MPIE, Düsseldorf, Germany (2013)
  10. 15.
    Ram, F.; Zaefferer, S.; Khorashadizadeh, A.; Jäpel, T.; Davut, K.: Electron Diffraction in Scanning Electron Microscope and its applications. Institut für Werkstofftechnik, Helmut Schmidt Universität, Hamburg, Germany (2012)
  11. 16.
    Ram, F.: EBSD projection centre’s importance and available methods for resolving it! Seminar Talk at Arbeitskreis EBSD in Garbsen, Garbsen, Germany (2012)
  12. 17.
    Ram, F.; Zaefferer, S.: Kikuchi Bandlet Method: A Method to Resolve the Source Point Position of an EBSD Pattern. EBSD 2012, London, UK (2012)
  13. 18.
    Ram, F.; Zaefferer, S.: Kikuchi Bandlet Method: A Method to Resolve the Source Point Position of an EBSD Pattern. 20th Annual meeting of the German Crystallographic Society, München, Germany (2012)

Poster (6)

  1. 19.
    Ram, F.; Zaefferer, S.; Jäpel, T.: On the accuracy and precision of orientations obtained by the conventional automated EBSD method. RMS EBSD 2014, London, UK (2014)
  2. 20.
    Ram, F.; Zaefferer, S.; Jäpel, T.: Error Analysis of the Crystal Orientations and Misorientations obtained by the Classical Electron Backscatter Diffraction Method. RMS EBSD 2014, London, UK (2014)
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