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Schwarz, T.; Stechmann, G.; Gault, B.; Cojocaru-Mirédin, O.; Würz, R.; Raabe, D.: Correlative transmission Kikuchi diffraction and atom probe tomography study of Cu(In,Ga)Se₂ grain boundaries. Progress in Photovoltaics: Research and Applications 26 (3), pp. 196 - 204 (2018)

Stechmann, G.; Zaefferer, S.; Raabe, D.: Molecular statics simulation of CdTe grain boundary structures and energetics using a bond-order potential. Modelling and Simulation in Materials Science and Engineering 26 (4), 045009 (2018)

Stechmann, G.; Zaefferer, S.; Schwarz, T.; Konijnenberg, P. J.; Raabe, D.; Gretener, C.; Kranz, L.; Perrenoud, J.; Bücheler, S.; Tiwari, A. N.: A correlative investigation of grain boundary crystallography and electronic properties in CdTe thin film solar cells. Solar Energy Materials and Solar Cells 166, pp. 108 - 120 (2017)

Stechmann, G.; Zaefferer, S.; Konijnenberg, P. J.; Raabe, D.; Gretener, C.; Kranz, L.; Perrenoud, J.; Bücheler, S.; Tiwari, A. N.: 3-Dimensional microstructural characterization of CdTe absorber layers from CdTe/CdS thin film solar cells. Solar Energy Materials and Solar Cells 151, pp. 66 - 80 (2016)

Zaefferer, S.; Stechmann, G.: Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells. In: Tagungsband des EFDS Workshops “Morphologie und Mikrostruktur Dünner Schichten und deren Beeinflussung” (Ed. Wetzig, K.). EFDS Workshop “Morphologie und Mikrostruktur Dünner Schichten und deren Beeinflussung”, Dresden, Germany, March 12, 2015. (2015)

Schwarz, T.; Stechmann, G.; Gault, B.; Cojocaru-Mirédin, O.; Würz, R.; Lomuscio, A.; Siebentritt, S.; Raabe, D.: Correlative transmission Kikuchi diffraction and atom probe tomography analysis of grain boundaries in Cu(In,Ga) Se₂ and CuInS₂. E-MRS Spring Meeting 2018, Strasbourg, France (2018)

Schwarz, T.; Stechmann, G.; Gault, B.; Cojocaru-Mirédin, O.; Würz, R.; Lomuscio, A.; Siebentritt, S.; Raabe, D.: Correlative transmission Kikuchi diffraction and atom probe tomography analysis of grain boundaries in Cu(In,Ga) Se₂ and CuInS₂ in thin film solar cells. APT&M 2018, NIST, Gaithersburg, MD, USA (2018)

Zaefferer, S.; Schemmann, L.; Stechmann, G.; Ram, F.; Archie, F. M. F.: Using orientation microscopy to explore the correlation of materials properties and microstructures. 25th International conference on materials and technology, Portorož, Slovenia (2017)

Schwarz, T.; Stechmann, G.; Gault, B.; Cojocaru-Mirédin, O.; Choi, P.-P.; Redinger, A.; Siebentritt, S.; Raabe, D.: Correlative transmission EBSD-APT analysis of grain boundaries in CIGS and CZTS based thin-film solar cells. Euromat, Thessaloniki, Greece (2017)

Schwarz, T.; Stechmann, G.; Gault, B.; Cojocaru-Mirédin, O.; Choi, P.-P.; Redinger, A.; Siebentritt, S.; Raabe, D.: Correlative transmission EBSD-APT analysis of grain boundaries in Cu(In,Ga)Se₂ and Cu₂ZnSnSe₄ based thin-film solar cells. Microscopy & Microanalysis, St. Louis, Missouri, USA (2017)

Stechmann, G.; Zaefferer, S.; Konijnenberg, P. J.; Schwarz, T.; Raabe, D.; Gretener, C.; Kranz, L.; Perrenoud, J.; Bücheler, S.; Tiwari, A. N.: Structure and Properties of Grain Boundaries in CdTe Solar Cells. E-MRS 2016 SPRING MEETING, Lille, France (2016)

Stechmann, G.; Zaefferer, S.: 3-dimensionnal Microstructural Characterization of CdTe-based Solar Cells. Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg, Stuttgart, Germany (2015)

Zaefferer, S.; Stechmann, G.: Electron backscatter diffraction (EBSD) and electron channelling contrast imaging (ECCI) for the study of thin film solar cells. Workshop Morphologie und Mikrostruktur dünner Schichten, Dresden, Germany (2015)

Stechmann, G.; Zaefferer, S.; Konijnenberg, P. J.; Raabe, D.; Gretener, C.; Kranz, L.; Perrenoud, J.; Bücheler, S.; Tiwari, A. N.: 3-Dimensional Microstructural and Crystallographic Characterization of CdTe Absorber Layers from CdTe/CdS Solar Cells Grown in Substrate Configuration. E-MRS, European Materials Research Society Conference 2014 , Lille, France (2014)

Konijnenberg, P. J.; Stechmann, G.; Zaefferer, S.; Raabe, D.: Advances in Analysis of 3D Orientation Data Sets Obtained by FIB-EBSD Tomography. 2nd International Congress on 3D Materials Science 2014, Annecy, France (2014)

Stechmann, G.; Zaefferer, S.; Konijnenberg, P. J.: Microstructural and Electronic Characterization of CdTe Thin Film Solar Cells: A Correlative SEM-Based Approach. IAMNano, Port Elizabeth, South Africa (2016)

Stechmann, G.; Zaefferer, S.: Microstructural and Electronic Characterization of CdTe Thin Film Solar Cells: A Correlative SEM-Based Approach. IAMNano, Hamburg, Germany (2015)

Zaefferer, S.; Mandal, S.; Stechmann, G.; Bozzolo, N.: Correlative measurement of the 5-parameter grain boundary character and its physical and chemical properties. RMS EBSD 2014, London, UK (2014)

Stechmann, G.: A Study on the Microstructure Formation Mechanisms and Functional Properties of CdTe Thin Film Solar Cells Using Correlative Electron Microscopy and Atomistic Simulations. Dissertation, RWTH Aachen, Aachen, Germany (2017)

Stechmann, G.: Compatibility between Molten Salts and Materials in Concentrated Solar Power Plants. Diploma, École Nationale Supérieure de Chimie de Lille, Lille, France (2013)