Publications of Christina Scheu

Hieke, S. W.; Dehm, G.; Scheu, C.: Investigation of solid state dewetting phenomena of epitaxial Al thin films on sapphire using electron microscopy. In: European Microscopy Congress 2016: Proceedings, pp. 203 - 204. The 16th European Microscopy Congress (EMC 2016), Lyon, France, August 28, 2016 - September 02, 2016. Wiley-VCH Verlag GmbH & Co KGaA (2016)

Liebscher, C.; Stoffers, A.; Cojocaru-Mirédin, O.; Gault, B.; Scheu, C.; Dehm, G.; Raabe, D.: Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT. In: Microscopy and Microanalysis, Vol. 22, pp. 46 - 47. 3rd Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , Saarbrücken, Germany, October 11, 2016 - October 12, 2016. (2016)

Guggenmos, A.; Radünz, S.; Rauhut, R.; Hofstetter, M.; Venkatesan, S.; Wochnik, A. S.; Scheu, C.; Gullikson, E. M.; Fischer, S.; Nickel, B. et al.; Kleineberg, U.: Attosecond broadband multilayer mirrors for the water window spectral range. In: Proceedings of SPIE, Vol. 9207, 92070L (Eds. Morawe, C.; Khounsary, A. M.; Goto, S.). Conference on Advances in X-Ray/EUV Optics and Components IX held as part of the SPIE 2014 International Symposium on Optics + Photonics, San Diego, CA, USA, August 18, 2014 - August 20, 2014. (2014)

Cha, L.; Scheu, C.; Dehm, G.: A TEM study of ultra-fine lamellar structures in titanium aluminide. In: 9th Multinational Microscopy Conference 2009 Materials Science, Vol. 3, pp. 247 - 248 (Eds. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, August 30, 2009 - September 04, 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Cha, L.; Scheu, C.; Dehm, G.; Schnitzer, R.; Clemens, H. J.: Initial stages of lamellae formation in high Nb containing γ-TiAl based alloys. In: Materials Research Society Symposium Proceedings 2009, Vol. 1128, pp. 153 - 158. MRS Fall Meeting 2009, Boston, MA, USA, November 30, 2009 - December 04, 2009. (2009)

Rashkova, B.; Zhang, Z.; Šturm, S.; Kothleitner, G.; Kutschej, K.; Mitterer, C.; Lazar, P.; Redinger, J.; Podloucky, R.; Scheu, C. et al.; Dehm, G.: EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates. In: 9th Multinational Microscopy Conference 2009, pp. 285 - 286 (Ed. Kothleitner, G.). 9th Multinational Microscopy Conference 2009, Graz, Austria, August 30, 2009 - September 04, 2008. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Rester, M.; Cha, L.; Scheu, C.; Dehm, G.; Clemens, H. J.; Kothleitner, G.; Leisch, M.: Microstructure of a massively transformed high Nb containing γ-TiAl based alloy. In: 9th Multinational Microscopy Conference 2009, pp. 231 - 232 (Eds. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, August 30, 2009. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Rashkova, B.; Kothleitner, G.; Šturm, S.; Scheu, C.; Kutschej, K.; Mitterer, C.; Lazar, P.; Redinger, J.; Podloucky, R.; Dehm, G.: A Comparison of the Electronic Structure of N–K in TiN and VN using EELS and Ab-initio Calculations. In: Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, pp. 414 - 415. Microscopy 33rd Conference, Deutsche Gesellschaft für Elektronenmikroskopie, Saarbrücken, Germany, September 02, 2007 - September 07, 2007. (2007)

Wetscher, F.; Pippan, R.; Šturm, S.; Kauffmann, F.; Scheu, C.; Dehm, G.: Microstructural evolution of a pearlitic steel during severe plastic deformation. In: 7th Multinational Congress on Microscopy. 7th Multinational Congress on Microscopy, Portorož, Slovenia, June 26, 2005 - June 30, 2005. (2005)

Oh, S. H.; Scheu, C.; Dehm, G.; Wagner, T. A.; Rühle, M.; Lee, H. J.: Direct atomic scale observation of dynamic alumina-aluminum solid-liquid interfaces. In: The 8th Asia-Pacific Conference on Electron Microscopy (8APEM): In Conjunction with the 60th Annual Meeting of the Japanese Society of Microscopy, pp. 671 - 672. 8th Asia-Pacific Conference on Electron Microscopy (8APEM), Kanazawa, Japan, June 07, 2004 - June 11, 2004. Die Japanische Gesellschaft für Mikroskopie, Uchinada-mati (Isikawa-ken), Japan (2004)

Dehm, G.; Scheu, C.; Rühle, M.: Interface Structure of Epitaxial Cu Films on (0001) α-Al₂O₃. In: Proceedings of the 14th ICEM, Vol. 2, pp. 567 - 568. 11th International Congress on Electron Microscopy, Dublin, Ireland, August 26, 1996 - August 30, 1996. (1998)

Rühle, M.; Dehm, G.; Scheu, C.: Structure and Composition of Interfaces in Ceramics and Ceramic Composites. In: Proc. of the International Materials Symposium on Ceramic Microstructures: Controll at the Atomic Level, pp. 1 - 12 (Eds. Tomsia, A. P.; Glaeser, A.). International Materials Symposium on Ceramic Microstructures: Controll at the Atomic Level, Berkley, CA, USA, June 24, 1996 - June 27, 1996. Plenum Press, New York (1998)

Scheu, C.; Dehm, G.; Kaplan, W. D.; Vilela, D.; Claussen, N. E.: Microstructure of Nb Based Al₂O₃ Composites. In: Proc. of 56rd Annual Meeting of MSA, pp. 588 - 589. 56rd Meeting of the Microscopy Society of America, Atlanta, GA, USA, July 12, 1998 - July 16, 1998. (1998)

Dehm, G.; Scheu, C.; Bamberger, M. S.: Microstructure of Ni₂B Laser-Induced Surface-Alloyed α-Fe. In: Laser Materials Processing, Vol. 83a, pp. 128 - 137. International Congress on Applications of Lasers and Electro-Optics’97, San Diego, CA, USA, 1997. (1997)

Dehm, G.; Scheu, C.: Atomic Structure of Internal Cu/Al₂O₃ Interfaces. In: Proc. of 54th annual meeting of MSA, Vol. 3, pp. 686 - 687. 54th Meeting of the Microscopy Society of America, Minneapolis, MN, USA, August 11, 1996 - August 15, 1996. (1996)

Berova, V.; Garzón-Manjón, A.; Vega-Paredes, M.; Scheu, C.; Jurzinsky, T.: Influence of Shell Thickness on Durability of Ru@Pt Core-Shell Catalysts for Reformate PEM Fuel Cells. In ECS Meeting Abstracts, MA2022-01 (35), p. 1528. The Electrochemical Society (2022)

Mattlat, D. A.; Li, J.; Bahrami, A.; Zhang, S.; Scheu, C.: Understanding the mechanisms behind Zn-diffusion in Zn4Sb3 thermoelectric materials for long term material stability. Global Conference of Innovation materials (GCIM) 2026, Seogwipo, South Korea (2026)

Hsu, Y.-L.; Schwarz, T. M.; Kostka, A.; Jang, K.; Scheu, C.; Tutken, T.; Gault, B.; Dumont, M.: Understanding the structure of dinosaur enamel at a near-atomic scale. European Atom Probe Tomography Workshop, Marseille, France (2025)

Isotta, E.; Zhang, S.; Ghosh, S.; de Boor, J.; Balogun, O.; Snyder, G. J.; Scheu, C.: Thermal conductivity imaging to advance microstructure engineering in thermoelectrics. European Conference on Thermoelectrics 2025, Nancy, France (2025)

Joo, M.; Xiu, H.; Cheng, N.; Somsen, C.; Baha, S.; Ludwig, A.; Li, Y.; Kostka, A.; Scheu, C.: Investigation of planar defect evolution in Au–Pd–Pt–Ru-based compositionally complex solid solution thin films using analytical transmission electron microscopy. The 2025 Fall Meeting of the European Materials Research Society (E-MRS), Warsaw, Poland (2025)