Felipe F. Morgado

Atom Probe Tomography
Department Microstructure Physics and Alloy Design
+49 211 6792 463
Hall 2

Main Focus

  • Field Ion Microscopy / Atom Probe Tomography
  • Analytical Field Ion Microscopy
  • Field evaporation, trajectory aberration, Saxey diagrams.

Curriculum Vitae

Mar/2019 to present – PhD at Max-Planck-Institut für Eisenforschung GmbH (MPIE), Düsseldorf, Germany.

Aug/2016 to Dec/2018 – Master degree in Applied Physics, University of São Paulo, Brazil.

Mar/2012 to Dec/2015 – Telecommunication Technology Systems, University of Campinas, Brazil.

Jan/2014 to Dec/2014 – Study Abroad UG College of Science and Engineering at University of Glasgow, Level 6, Scotland.

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