© G. Geelen, Max-Planck-Institut für Eisenforschung GmbH

Workshops

Host: Co-Organizer Prof. G. Dehm

Gordon Research Conference “Thin Film and Small Scale Mechanical Behavior”

Gordon Research Conference “Thin Film and Small Scale Mechanical Behavior”

Mini‐symposium “Experimental Micromechanics and Nanomechanics” at the “10th edition of the European Solids Mechanics Conference”

Mini‐symposium “Experimental Micromechanics and Nanomechanics” at the “10th edition of the European Solids Mechanics Conference”

Symposium “Mechanical Properties and Adhesion 45th ICMCTF (International Conference on Metallurgical Coatings and Thin Films)

Symposium “Mechanical Properties and Adhesion 45th ICMCTF (International Conference on Metallurgical Coatings and Thin Films)

Topic day “Novel materials and alloy design - microstructure property relationship” at the Metallkundekolloquium/Arlbergkolloquium

Topic day “Novel materials and alloy design - microstructure property relationship” at the Metallkundekolloquium/Arlbergkolloquium

"Fundamentals of mechanical response" at the Conference on Electronic and Advanced Materials

Fundamentals of mechanical response

Symposium “Environmental, in-situ and time-resolved microscopy” at MC 2017 (Microscopy Conference 2017)

Symposium “Environmental, in-situ and time-resolved microscopy” at MC 2017 (Microscopy Conference 2017)

Symposium “Mechanical Properties and Adhesion 44th ICMCTF (International Conference on Metallurgical Coatings and Thin Films)

Symposium “Mechanical Properties and Adhesion 44th ICMCTF (International Conference on Metallurgical Coatings and Thin Films)

Topic day “Lokale Charakterisierungsmethoden in der Werkstoffforschung” at the Metallkundekolloquium/Arlbergkolloquium

Topic day “Lokale Charakterisierungsmethoden in der Werkstoffforschung” at the Metallkundekolloquium/Arlbergkolloquium

Symposium ”In-situ Microscopy with Electrons, X-Rays and Scanning Probes in Materials Science“

Symposium ”In-situ Microscopy with Electrons, X-Rays and Scanning Probes in Materials Science“
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