EBSD 2011 - 20th Annual Meeting at the MPIE

EBSD 2011 - 20th Annual Meeting at the MPIE

  • Start: Mar 28, 2011 12:00 AM (Local Time Germany)
  • End: Mar 31, 2011 12:00 AM
  • Location: Max-Planck-Institut für Eisenforschung GmbH
  • Room: Seminar Room 1
  • Host: Dr. Stefan Zaefferer
The 20th annual meeting on Electron Back Scattering Diffraction (EBSD) techniques will take place from March 28-31 at the MPIE Düsseldorf. Stefan Zaefferer, head of the group 'Microscopy and Diffraction' and organiser of the conference, expects around 100 delegates from the relevant field which probably makes this meeting one of the largest ever held in this series. EBSD is a powerful and ever-developing tool for microstructure characterization in the scanning electron microscope. Besides its standard applications for quantitative microstructure investigations there are many emerging fields of applications where the technique reaches into the regions of classical x-ray and transmission electron microscopy investigations. Since its beginnings the English Royal Microscopical Society (RMS) accompanied this development by organizing annual meetings on the subject, usually in Great Britain. This is the first time that the meeting is held outside of Great Britain. On these meetings the leading experts and the everyday users join to discuss applications and developments in technique and equipment.
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