Schwarz, T.; Woods, E.; Aota, L. S.; Zhou, X.; McCaroll, I.; Gault, B.: APT towards liquid-solid interfaces to study early-stage corrosion mechansim. 9th NRW-APT user meeting, Düsseldorf, Germany (2023)

Todorova, M.; Yoo, S.-H.; Kim, S.-H.; Gault, B.; Neugebauer, J.: Controlling doping of electrocatalysts though engineering impurities … and the H/Pt/H₂O interface. KPS 2023 Conference, Daejeon, Korea (2023)

Saksena, A.; Sun, B.; Khanchandani, H.; Gault, B.: Visualizing radiation-induced damage by Hydrogen/Deuterium. Conference talk at DPG Spring Meeting 2023 (SKM23), Dresden, Germany (2023)

Ferraz Morgado, F.; Bhatt, S.; Stephenson, L.; Mouton, I.; Neugebauer, J.; Raabe, D.; Freysoldt, C.; Gault, B.; Katnagallu, S.: Role of Simulations and Experiments in Analytical Field Ion Microscopy. Invited Seminar, Hyderabad University, Hyderabad, India (2023)

Woods, E.; Singh, M. P.; Aota, L. S.; Kim, S.-H.; El-Zoka, A.; Douglas , J.; Schwarz, T.; Krämer, M.; Chang, K.; Gault, B.: Observations on Improved Cryogenic Lift-Out Methods: Optimised Sample Preparation. Talk at Korea Institute of Science and Technology, Seoul, South Korea (2023)

Ferraz Morgado, F.; Bhatt, S.; Stephenson, L.; Mouton, I.; Neugebauer, J.; Raabe, D.; Freysoldt, C.; Gault, B.; Katnagallu, S.: Role of Simulations and Experiments in Analytical Field Ion Microscopy. Microscopy and Microanalysis 29 (Supplement_1), p. 602 (2023)

Krämer, M.; Favelukis, B.; Sokol, M.; Rosen, B. A.; Eliaz, N.; Kim, S.-H.; Gault, B.: Facilitating Atom Probe Tomography of Free-Standing 2D MXene Films. Atom Probe Tomography & Microscopy (APT&M) 2023, Leuven, Belgium (2023)

Schwarz, T.; Woods, E.; Singh, M. P.; Jung, C.; Aota, L. S.; Jang, K.; Krämer, M.; Kim, S.-H.; McCaroll, I.; Gault, B.: In-situ metallic coating of atom probe specimen for enhanced yield, performance, and increased field-of-view. APT&M 23, Leuven, Belgium (2023)

Schwarz, T.; Woods, E.; Aota, L. S.; Zhou, X.; McCaroll, I.; Gault, B.: Application of cryo-atom probe tomography to study early-stage corrosion mechanism at liquid-solid interfaces at near atomic scale. EuroCorr 2023, Bruessles, Belgium (2023)

Gault, B.: Graduate course on Atom Probe Tomography, as part of the Centre for Doctoral Training on Materials Charactisation. Lecture: SS 2023, Imperial College London, UK, 2023-04 - 2023-07

Gault, B.: 3rd year course on Engineering alloys. Lecture: SS 2023, Imperial College London, UK, 2023-04 - 2023-07

Neuß, D.; McCaroll, I.; Zhang, S.; Woods, E.; Delis, W. J.; Tanure, L.; Springer, H.; Sandlöbes, S.; Yang, J.; Todorova, M. et al.; Zander, D.; Scheu, C.; Schneider, J. M.; Hans, M.: High-resolution chemical and structural characterization of the native oxide scale on a Mg-based alloy. arXiv (2023)

El-Zoka, A.; Stephenson, L.; Kim, S.-H.; Gault, B.; Raabe, D.: The fate of water in hydrogen-based iron oxide reduction. arXiv (2023)

Kim, S.-H.; Yoo, Su, S.-H.; Aota, L. S.; El-Zoka, A.; Kang, P. W.; Lee, Y.; Gault, B.: B dopant evolution in Pd catalysts after H evolution/oxidation reaction in alkaline environment. arXiv (2023)

Singh, M. P.; Woods, E.; Kim, S.-H.; Jung, C.; Aota, L. S.; Gault, B.: Facilitating the systematic nanoscale study of battery materials by atom probe tomography through in-situ metal coating. arXiv (2023)

Woods, E.; Kim, S.-H.; El-Zoka, A.; Stephenson, L.; Gault, B.: Scalable Substrate Development for Aqueous Biological Samples for Atom Probe Tomography. arXiv (2023)

Woods, E.; Saksena, A.; El-Zoka, A.; Stephenson, L.; Schwarz, T.; Singh, M. P.; Aota, L. S.; Kim, S.-H.; Schneider, J. M.; Gault, B.: Nanoporous gold thin films as substrates to analyze liquids by cryo-atom probe tomography. arXiv (2023)

Woods, E.; Singh, M. P.; Kim, S.-H.; Schwarz, T.; Douglas, J. O.; El-Zoka, A.; Giulani , F.; Gault, B.: A versatile and reproducible cryo-sample preparation methodology for atom probe studies. arXiv (2023)

Zhou, X.; Mathews, P.; Berkels, B.; Ahmad, S.; Alhassan, A. S. A.; Keuter, P.; Schneider, J. M.; Raabe, D.; Neugebauer, J.; Dehm, G. et al.; Hickel, T.; Scheu, C.; Zhang, S.: Constructing phase diagrams for defects by correlated atomic-scale characterization. arXiv (2023)