Peng, Z.; Meiners, T.; Gault, B.; Liebscher, C.; Raabe, D.; Lu, Y.: A Methodology for Investigation of Grain-Boundary Diffusion and Segregation. In: MicroscopyMicroanalysis, Vol. 23, pp. 656 - 657. Microscopy & Microanalysis 2017, St. Louis, MO, USA, August 06, 2017 - August 10, 2017. (2017)

Peng, Z.; Rohwerder, M.; Friedrichs, M.; Choi, P.-P.; Gault, B.; Meiners, T.; Kreilkamp, H.; Klocke, F.; Raabe, D.: Degradation Mechanism of Molds for Precision Glass Molding. In: MicroscopyMicroanalysis, Vol. 23, pp. 698 - 699. Microscopy & Microanalysis 2017, St. Louis, MO, USA, August 06, 2017 - August 10, 2017. (2017)

Schwarz, T.: Untersuchung von Defekten in polykristallinen Dünnschichten mittels Atomsondentomographie. gmr2 – Gesellschaft für Materialografie Rhein-Ruhr e.V., MPIE, Düsseldorf, Germany (2017)

Raabe, D.; Gault, B.; Breen, A. J.; Yao, M.; Zhao, H.; Ponge, D.; Stoffers, A.: Textures Studied at Near Atomic-Scale. 18th International Conference on Textures of Materials (ICOTOM-18), St. George, UT, USA (2017)

Mouton, I.; Katnagallu, S.; Yao, M.; Liebscher, C.; Cojocaru-Mirédin, O.; Schwarz, T.; Makineni, S. K.; Raabe, D.; Gault, B.: Automated calibration of the atom probe tomography reconstructions with electron microscopy images. 7th European Atom Probe Workshop, Gullmarsstrand, Sweden (2017)

Raabe, D.; Gault, B.; Breen, A. J.; Chang, Y.; Yao, M.; Ponge, D.; Herbig, M.; Liebscher, C.; Scheu, C.: Atomic- and multiscale observation of segregation. Eindhoven Multiscale Institute (EMI) Symposium, Eindhoven University, Eindhoven, The Netherlands (2017)

Stephenson, L.; Mouton, I.; Rusitzka, A. K.; Gault, B.: Milled geometries for supporting initially liquid samples. European Atom Probe Workshop, Gullmarsstrand, Sweden (2017)

Ulfig, R. M.; Kelly, T. F.; Prosa, T. J.; Shepard, J.; Gault, B.; Stephenson, L.; von Gunten, D.; Maier, U.; Köster, S. A.; Reinhard, D. A.: Applications, Technical Challenges, and Recent Implementation of a UHV/Cryogenic Specimen Transfer System for Atom Probe Tomography. 7th European Atom Probe Workshop, Gullmarsstrand, Sweden (2017)

Ponge, D.; Tasan, C. C.; Springer, H.; Gutiérrez-Urrutia, I.; Koyama, M.; Kuzmina, M.; Wang, M.; Morsdorf, L.; Gault, B.; Seol, J. B. et al.; Choi, P.-P.; Liebscher, C.; Yao, M.; Li, Z.; Wang, H., H.; Neugebauer, J.; Scheu, C.; Raabe, D.: 1 Billion Tons of Nanostructure - Metastability Alloy Design and Segregation Engineering. 38th Risø Intern. Symp. Materials Science Advanced Metallic Materials by Microstructural Design , Roskilde, Denmark (2017)

Rusitzka, A. K.; Stephenson, L.; Gremer, L.; Raabe, D.; Willbold, D.; Gault, B.: Getting insights to Alzheimer‘s disease by atom probe tomography. 6th International caesar conference, Overcoming Barriers — atomic-resolution and beyond: advances in molecular electron microscopy, Bonn, Germany (2017)

Schwarz, T.; Stechmann, G.; Gault, B.; Cojocaru-Mirédin, O.; Choi, P.-P.; Redinger, A.; Siebentritt, S.; Raabe, D.: Correlative transmission EBSD-APT analysis of grain boundaries in CIGS and CZTS based thin-film solar cells. Euromat, Thessaloniki, Greece (2017)

Zhang, S.; Hufnagel, A.; Hajiyani, H. R.; Li, T.; Gault, B.; Fattakhova-Rohlfing, D.; Bein, T.; Pentcheva, R.; Scheu, C.: Sub-nanometer microanalysis on hematite photoanodes with localized Sn dopants to enhance photocatalytic water splitting. 13th Multinational Congress on Microscopy, Rovinj, Croatia (2017)

Kürnsteiner, P.; Wilms, M. B.; Weisheit, A.; Barriobero-Vila, P.; Gault, B.; Jägle, E. A.; Raabe, D.: In-process Precipitation During Laser Additive Manufacturing Investigated by Atom Probe Tomography. Microscopy & Microanalysis, St. Louis, MO, USA (2017)

Meiners, T.; Peng, Z.; Gault, B.; Liebscher, C.; Dehm, G.: Sulfur-induced embrittlement of copper. Microscopy congress 2017 – Dreiländertagung (MC 2017), Lausanne, Switzerland (2017)

Peng, Z.; Gault, B.; Raabe, D.: On the Multiple Event Detection in Atom Probe Tomography. Microscopy & Microanalysis 2017 Conference, St. Louis, MO, USA (2017)

Ponge, D.; Tasan, C. C.; Springer, H.; Koyama, M.; Kuzmina, M.; Wang, M.; Morsdorf, L.; Gault, B.; Seol, J. B.; Liebscher, C. et al.; Yao, M.; Li, Z.; Gutiérrez-Urrutia, I.; Wang, H.; Neugebauer, J.; Scheu, C.; Raabe, D.: Metastability Alloy Design. 16th Intern. Conference on Rapidly Quenched and Metastable Materials (RQ16), Leoben, Austria (2017)

Schwarz, T.; Stechmann, G.; Gault, B.; Cojocaru-Mirédin, O.; Choi, P.-P.; Redinger, A.; Siebentritt, S.; Raabe, D.: Correlative transmission EBSD-APT analysis of grain boundaries in Cu(In,Ga)Se₂ and Cu₂ZnSnSe₄ based thin-film solar cells. Microscopy & Microanalysis, St. Louis, Missouri, USA (2017)

Raabe, D.; Gault, B.; Breen, A. J.; Chang, Y.; Yao, M.; Ponge, D.; Herbig, M.; Liebscher, C.; Tarzimoghadam, Z.; Dehm, G. et al.; Scheu, C.; Stoffers, A.; Neugebauer, J.: Multiprobe and Multiscale Characterisation of complex Materials. Fraunhofer Conference ‘The Future of Materials – Materials Future‘, Halle, Germany (2017)

Gault, B.; De Geuser, F.; Katnagallu, S.; Nematollahi, G. A.; Dagan, M.; Parviainen, S.; Rusitzka, A. K.; Johnson, E.; Sundell, G.; Andersson, M. et al.; Stephenson, L.; Neugebauer, J.; Moody, M. P.; Vurpillot, F.; Raabe, D.: Reconstructing field ion microscopy and atom probe data. Australian Atom Probe Workshop, Magnetic Island, Australia (2017)

Raabe, D.; Gault, B.; Yao, M.; Scheu, C.; Liebscher, C.; Herbig, M.: Correlated and simulated electron microscopy and atom probe tomography. Workshop on Possibilities and Limitations of Quantitative Materials Modeling and Characterization 2017, Bernkastel, Germany (2017)