Fenster, J. C.; Rohwerder, M.; Hassel, A. W.: The impedance-titrator: A novel setup to perform automated pH-dependent electrochemical experiments. Materials and Corrosion-Werkstoffe und Korrosion 60 (11), pp. 855 - 858 (2009)
Chen, Y.; Schuhmann, W.; Hassel, A. W.: Electrocatalysis on gold nanostructures: Is the {110} facet more active than the {111} facet? Electrochem. Comm. 11, pp. 2036 - 2039 (2009)
Mardare, A. I.; Hassel, A. W.: Quantitative optical recognition of highly reproducible ultra thin oxide films in microelectrochemical anodisation. Rev. Sci Instrum. 80, pp. 046106-1 - 046106-3 (2009)
Mardare, A. I.; Savan, A.; Ludwig, A.; Wieck, A. D.; Hassel, A. W.: A combinatorial passivation study of Ta–Ti alloys. Corrosion Science 51, pp. 1519 - 1527 (2009)
Mardare, A. I.; Savan, A.; Ludwig, A.; Wieck, A. D.; Hassel, A. W.: High-throughput synthesis and characterization of anodic oxides on Nb–Ti alloys. Electrochimica Acta 54, pp. 5973 - 5980 (2009)
Mardare, A. I.; Savan, A.; Ludwig, A.; Wieck, A. D.; Hassel, A. W.: High throughput study of the anodic oxidation of Hf–Ti thin films. Electrochimica Acta 54, pp. 5171 - 5178 (2009)
Milenkovic, S.; Smith, A. J.; Hassel, A. W.: Single crystalline Molybdenum nanowires and nanowire arrays. J. Nanosci. Nanotechnol. 9 (6), pp. 3411 - 3417(7) (2009)
Mozalev, A.; Smith, A. J.; Borodin, S.; Plihauka, A.; Hassel, A. W.; Sakairi, M.; Takahashi, H.: Growth of multioxide planar film with the nanoscale inner structure via anodizing Al/Ta layers on Si. Electrochim. Acta 54, pp. 935 - 945 (2009)
Bello Rodriguez, B.; Hassel, A. W.: Passivity of a Nanostructured ds-NiAl–Re Alloy as Substrate for the Electrodeposition of Gold. Journal of the Electrochemical Society 155 (3), pp. K31 - K37 (2008)
Bello Rodriguez, B.; Hassel, A. W.: Electrochemical Nucleation and Growth of Gold on Rhenium Nanowires. J. Electrochem. Plat. Technol. 1, pp. 47 - 55 (2008)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
In order to prepare raw data from scanning transmission electron microscopy for analysis, pattern detection algorithms are developed that allow to identify automatically higher-order feature such as crystalline grains, lattice defects, etc. from atomically resolved measurements.