Cojocaru-Mirédin, O.; Schwarz, T.; Choi, P.; Würz, R.; Abou-Ras, D.; Dietrich, J.; Raabe, D.: Exploring the internal interfaces at the atomic-scale in Cu(In,Ga)Se2 thin-films solar cells. 1st EU APT Workshop, CEA/MINATEC, Grenoble, France (2012)
Cojocaru-Mirédin, O.; Choi, P.; Würz, R.; Abou-Ras, D.; Raabe, D.: Study on internal interfaces in CIGS thin-films solar cells using atom probe tomography. 27th EU PVSEC, Frankfurt, Germany (2012)
Schwarz, T.; Cojocaru-Mirédin, O.; Choi, P.; Würz, R.: Atomic-scale analysis of Cu(In,Ga)Se2 grain boundaries. 27th European Photovoltaic Solar Energy Conference and Exhibition, Frankfurt a. M., Germany (2012)
Schwarz, T.; Cojocaru-Mirédin, O.; Choi, P.; Würz, R.: Study of impurities redistribution inside the cigs absorber layer by atom probe tomography. Photovoltaic Technical Conference - Thin Film & Advanced Silicon Solutions 2012 (PVTC 2012), Aix-en-Provence, France (2012)
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
Atom probe tomography (APT) is one of the MPIE’s key experiments for understanding the interplay of chemical composition in very complex microstructures down to the level of individual atoms. In APT, a needle-shaped specimen (tip diameter ≈100nm) is prepared from the material of interest and subjected to a high voltage. Additional voltage or laser…