Kobayashi, S.; Zaefferer, S.: Microstructure Control Using Phase Transformations in Ternary Gamma TiAl Alloys. Seminar talk, Universität Kassel, Kassel Germany (2006)
Zaefferer, S.: 3D-orientation microscopy in a FIB-SEM: A new dimension of microstructure characterization. 13th Conference on Electron Backscatter Diffraction, Oxford, UK (2006)
Bastos, A.; Zaefferer, S.; Raabe, D.: Orientation microscopy on electrodeposited samples. 13th Conference and Workshop on Electron Backscatter Diffraction, Oxford, UK (2006)
Bastos, A.; Zaefferer, S.; Raabe, D.: Characterization of microstructure and Texture of nanostructure electrodeposited NiCo samples by use of Electron Backscatter Diffraction (EBSD). DPG – Spring meeting, Dresden, Germany (2006)
Kobayashi, S.; Zaefferer, S.: Optimisation of Precipitation for the Development of Heat Resistant Fe3Al-based Alloys. Seminar talk, National Institute for Materials Science (NIMS), Tsukuba, Japan (2006)
Zaefferer, S.: Application of orientation microscopy in SEM and TEM for the study of texture formation during recrystallisation processes. Materials Science Seminar, Institute for Materials Science, Krakow, Poland (2005)
Zaefferer, S.: Möglichkeiten und Grenzen der Orientierungsmikroskopie mittels EBSD im Rasterelektronenmikroskop. Werkstoffausschuss & Unterausschuss für Metallographie, Werkstoffanalytik und -simulation des VdeH, Düsseldorf (2005)
Dorner, D.; Lahn, L.; Zaefferer, S.; Raabe, D.: Fundamental Research on Microstructure and Microtexture Development in Grain-oriented Silicon Steel: The Evolution of the Goss orientation. 17th Soft Magnetic Materials Conference (SMM17), Bratislava, Slovakia (2005)
Sato, H.; Zaefferer, S.: A study on the crystal orientation relationship of butterfly martensite in an Fe30 % Ni alloy by 3-D EBSD-based orientation microscopy. Microscopy Conference 2005, Davos, Switzerland (2005)
Zaefferer, S.; Konrad, J.; Raabe, D.: 3D-Orientation Microscopy in a Combined Focused Ion Beam (FIB) - Scanning Electron Microscope: A New Dimension of Microstructure Characterisation. Microscopy Conference 2005, Davos, Switzerland (2005)
Bastos da Silva, A. F.; Raabe, D.; Zaefferer, S.: Experiments on the local mechanics and texture evolution of nanocrystalline Nickel. 14th International Conference on Textures of Materials (ICOTOM 14), Leuven, Belgium (2005)
Zaefferer, S.: Application of orientation microscopy in SEM and TEM for the study of texture formation during recrystallisation processes. 14th International Conference on Textures of Materials (ICOTOM 14), Leuven, Belgium (2005)