Schwarz, T.; Cojocaru-Mirédin, O.; Choi, P.; Würz, R.: Atomic-scale analysis of Cu(In,Ga)Se2 grain boundaries. 27th European Photovoltaic Solar Energy Conference and Exhibition, Frankfurt a. M., Germany (2012)
Schwarz, T.; Cojocaru-Mirédin, O.; Choi, P.; Würz, R.: Study of impurities redistribution inside the cigs absorber layer by atom probe tomography. Photovoltaic Technical Conference - Thin Film & Advanced Silicon Solutions 2012 (PVTC 2012), Aix-en-Provence, France (2012)
Cojocaru-Mirédin, O.; Choi, P.; Schwarz, T.; Würz, R.; Raabe, D.: Exploring the internal interfaces at the atomic-scale in CIGS thin-films solar cells. DPG-Frühjahrstagung Modern, Atom Probe Tomography, TU Berlin, Germany (2012)
Cojocaru-Mirédin, O.; Schwarz, T.; Choi, P.; Würz, R.; Raabe, D.: Exploring the internal interfaces at the atomic-scale in thin-film solar cells. Seminar Talk at Helmholtz Zentrum Berlin (HZB), Berlin, Germany (2012)
Changizi, R.; Lim, J.; Zhang, S.; Schwarz, T.; Scheu, C.: Characterization of KCa2Nb3O10. IAMNano 2019, International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, Düsseldorf, Germany (2019)
Changizi, R.; Zhang, S.; Schwarz, T.; Scheu, C.: Cathodoluminescence and the structural study of Lanthanide-doped oxides. Workshop on Transmission Electron Microscopy (E-MAT), Antwerp, Belgium (2019)
Changizi, R.; Zhang, S.; Schwarz, T.; Scheu, C.: Study of the chemical composition and the luminescent spectra of Lanthanide-doped oxides. E-MRS 2019 Spring Meeting, Nice, France (2019)
Cojocaru-Mirédin, O.; Schwarz, T.; Choi, P.; Würz, R.; Raabe, D.: Characterization of Cu(In,Ga)Se2 grain boundaries using atom probe tomography. 2013 MRS Spring Meeting & Exhibit, San Francisco, CA, USA (2013)
Max Planck scientists design a process that merges metal extraction, alloying and processing into one single, eco-friendly step. Their results are now published in the journal Nature.
Scientists of the Max-Planck-Institut für Eisenforschung pioneer new machine learning model for corrosion-resistant alloy design. Their results are now published in the journal Science Advances
In order to prepare raw data from scanning transmission electron microscopy for analysis, pattern detection algorithms are developed that allow to identify automatically higher-order feature such as crystalline grains, lattice defects, etc. from atomically resolved measurements.