Publications of Xinren Chen

Chen, X.; Gonçalves, W.; Hu, Y.; Gao, Y.; Harrison, P.; Dehm, G.; Gault, B.; Ludwig, W.; Rauch, E.; Zhou, X. et al.; Raabe, D.: Secondary grain boundary dislocations alter segregation energy spectra. Nature Communications 16 (1), 8422 (2025)

Harrison, P.; Das, S. M.; Gonçalves, W.; da Silva, A.; Chen, X.; Viganò, N.; Liebscher, C.; Ludwig, W.; Zhou, X.; Rauch, E.: Determination of five-parameter grain boundary characteristics in nanocrystalline Ni–W by scanning precession electron diffraction tomography. Ultramicroscopy 267, 114038 (2024)