![a: © Polizeiinspektion Stade b: © Fa. Schaeffler d: ©RWTH Aachen c und e: © Max-Planck Institut für Eisenforschung GmbH a: © Polizeiinspektion Stade b: © Fa. Schaeffler d: ©RWTH Aachen c und e: © Max-Planck Institut für Eisenforschung GmbH](/3832778/header_image-1535970067.jpg?t=eyJ3aWR0aCI6ODQ4LCJmaWxlX2V4dGVuc2lvbiI6ImpwZyIsIm9ial9pZCI6MzgzMjc3OH0%3D--544a9c4e9518366ca0bad4e61a300220959fe527)
Publications of Carmen Pérez León
All genres
Journal Article (2)
1.
Journal Article
95 (24), 245412 (2017)
Atomically resolved scanning force studies of vicinal Si(111). Physical Review B 2.
Journal Article
7 (3), pp. 426 - 430 (2016)
Atomic-Scale Imaging of the Surface Dipole Distribution of Stepped Surfaces. The Journal of Physical Chemistry Letters Talk (1)
3.
Talk
A joint first principles and Kelvin Probe Force Microscopy study of stepped Silicon Surfaces with Unprecedented Resolution. APS March Meeting 2015 , San Antonio, TX, USA (2015)