Publications of O. Cojocaru-Mirédin
98, pp. 103504-1 - 103504-3 (2011)Atomic-scale characterization of the CdS/CuInSe2 interface in thin-film solar cells. Applied Physics Letters
111 (6), pp. 552 - 556 (2011)Atomic-scale distribution of impurities in CuInSe2-based thin-film solar cells. Ultramicroscopy
2-2, pp. 523 - 567. wiley, Hoboken, NJ, USA (2016)Accessing Elemental Distributions in Thin Films for Solar Cells. In: Advanced Characterization Techniques for Thin Film Solar Cells: Second Edition, Vol.
22, pp. 46 - 47. 3rd Conference on In Situ and Correlative Electron Microscopy (CISCEM 2016) , Saarbrücken, Germany, October 11, 2016 - October 12, 2016. (2016)Topological Impurity Segregation at Faceted Silicon Grain Boundaries Studied by Correlative Atomic-Resolution STEM and APT. In: Microscopy and Microanalysis, Vol.
Interface engineering and nanoscale characterization of Zn(S,O) alternative buffer layer for CIGS thin film solar cells. In: 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015, 7355889. 42nd Photovoltaic Specialist Conference, PVSC 2015, Category numberCFP15PSC-ART; Code 118514, New Orleans, LA, USA, June 14, 2015 - June 19, 2015. Institute of Electrical and Electronics Engineers Inc., Piscataway Township, NJ, USA (2015)
Cd and impurity redistribution at the p-n junction of CIGS based solar cells resolved by atom-probe tomography. In: Photovoltaic Specialist Conference (PVSC), pp. 1 - 6 (Ed. IEEE ). Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd , New Orleans, LA, USA, June 14, 2015 - June 19, 2015. (2015)
Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. In: 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014, 6925089, pp. 42 - 46. 40th IEEE Photovoltaic Specialist Conference, PVSC 2014, Denver, CO, USA, June 08, 2014 - June 13, 2014. (2014)
20, pp. 394 - 395 (Eds. J.E., M.; D.C., B.; A., G.; Y.N., P.; J.P., S. et al.). Microscopy and Microanalysis 2014, M and M 2014, Hartford, CT, USA, August 03, 2014 - August 07, 2014. Cambridge University Press, New York, NY (2014)Nano-scale characterization of thin-film solar cells. In: Microscopy and Microanalysis, Vol.
Impurity segregation at CuInSe2-based grain boundaries. Proceedings of 3rd Intern. Conf. "Adv. Comp. Mater. Eng.", Transilvania University, Brasov, Romania, 2010., (2010)
Parallel Dislocation Networks and Cottrell Atmospheres Reduce Thermal Conductivity of PbTe Thermoelectrics. Virtual Thermoelectric Conference 2021 (VCT 2021) (2021)
Detailed structure and chemistry of structural defects in PbTe based alloys. Virtual Thermoelectric Conference 2020 (VCT 2020) (2020)
How do grain boundaries transform on the atomic level? International Workshop on Advanced and In-situ Microscopies of Functional Nanomaterials and Devices, IAMNano 2019, Düsseldorf, Germany (2019)
Effect of planar defects on the thermal conductivity of Ag16.7Sb30Te53.3 bulk thermoelectric. 6th German/Korean Thermoelectric workshop, Daegu, South Korea (2019)
The importance of crystallographic defects in Ag16.7Sb30Te53.3 thermoelectric bulk materials for the thermoelectric properties. EBSD conference 2019, National Physical Laboratory, Teddington, London, UK (2019)
Asymmetric Line Segregation at Faceted Si Grain Boundaries. TMS 2019 Annual Meeting & Exhibition, San Antonio, TX, USA (2019)
Correlation of Microstructures and Thermal Conductivity of the Thermoelectric Material Ag16.7Sb30Te53.3. North American Thermoelectric workshop, Northwestern University, Eanston, Chicago, IL, USA (2019)
The thermal conductivity of Ag16.7Sb30Te53.3 bulk thermoelectric with high density of planar faults. 38th/4th International and Asian Conference on Thermoelectrics , Gyeongju, South Korea (2019)
Correlation of crystallographic defects in Ag16.7 Sb30Te53.3 thermoelectric bulk materials with their thermoelectric properties. MRS Fall Meeting & Exhibit, Boston, MA, USA (2018)
Influence of microstructure of Ag16.7Sb30Te53.3 bulk thermoelectric on their performance. 37th | 16th International and European Conference on Thermoelectrics, Caen, France (2018)
Calibration of Atom Probe Tomography Reconstructions from Correlation with Electron Tomograms or Micrographs. APT&M 2018, NIST, Gaithersburg, MD, USA (2018)