Search results

Journal Article (1)

1.
Journal Article
Volkert, C. A.; Busch, S.; Heiland, B.; Dehm, G.: Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling. Journal of Microscopy 214 (3), pp. 208 - 212 (2004)

Conference Paper (1)

2.
Conference Paper
Dehm, G.; Legros, M.; Heiland, B.: In-situ TEM straining experiments of Al films on polyimide using a novel FIB design for specimen preparation. 10th Meeting on Frontiers of Electron Microscopy in Materials Science, Maastricht, The Netherlands, September 25, 2005 - September 30, 2005. Journal of Materials Science 41 (14), pp. 4484 - 4489 (2006)
Go to Editor View