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Journal Article (1)
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1.Journal ArticleGrain boundary segregation in multicrystalline silicon: correlative characterization by EBSD, EBIC, and atom probe tomography. Progress in Photovoltaics: Research and Applications 23 (12), pp. 1742 - 1753 (2015)
Conference Paper (1)
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2.Conference PaperGrain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. In: 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014, pp. 42 - 46. 40th IEEE Photovoltaic Specialist Conference, PVSC 2014, Denver, CO, USA, June 08, 2014 - June 13, 2014. (2014)
Talk (3)
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3.TalkGrain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. 40th IEEE Photovoltaic Specialists Conference, Denver, CO, USA (2014)
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4.TalkA correlative EBSD, EBIC and APT study of grain boundary segregation in multicrystalline silicon. Atom Probe Tomography & Microscopy 2014, Stuttgart, Germany (2014)
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5.TalkRecombination activity at the atomic scale: Correlative analysis of grain boundaries in multicrystalline silicon solar cells. Euromat 2013, Sevilla, Spain (2013)