Publications of Petr Lazar

Zhang, Z.; Rashkova, B.; Dehm, G.; Lazar, P.; Redinger, J.; Podloucky, R.: Unveiling the atomic and electronic structure of the VN/MgO interface. Physical Review B 82, pp. 060103-1 - 060103-4 (2010)

Lazar, P.; Rashkova, B.; Redinger, J.; Podloucky, R.; Mitterer, C.; Scheu, C.; Dehm, G.: Interface structure of epitaxial (111) VN films on (111) MgO substrates. Thin Solid Films 517 (3), pp. 1177 - 1181 (2008)

Lazar, P.; Redinger, J.; Strobl, J.; Podloucky, R.; Rashkova, B.; Dehm, G.; Kothleitner, G.; Šturm, S.; Kutschej, K.; Mitterer, C. et al.; Scheu, C.: N–K electron energy-loss near-edge structures for TiN/VN layers: an ab initio and experimental study. Analytical and Bioanalytical Chemistry 390 (6), pp. 1447 - 1453 (2008)

Rashkova, B.; Lazar, P.; Redinger, J.; Podloucky, R.; Kothleitner, G.; Šturm, S.; Kutschej, K.; Mitterer, C.; Scheu, C.; Dehm, G.: Combined ab-initio and N–K, Ti-L_2,3, V-L_2,3 electron energy-loss near edge structure studies for TiN and VN films. Zeitschrift für Metallkunde/Materials Research and Advanced Techniques 98 (11), pp. 1060 - 1065 (2007)

Rashkova, B.; Zhang, Z.; Šturm, S.; Kothleitner, G.; Kutschej, K.; Mitterer, C.; Lazar, P.; Redinger, J.; Podloucky, R.; Scheu, C. et al.; Dehm, G.: EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates. In: 9th Multinational Microscopy Conference 2009, pp. 285 - 286 (Ed. Kothleitner, G.). 9th Multinational Microscopy Conference 2009, Graz, Austria, August 30, 2009 - September 04, 2008. Verlag der Technischen Universität Graz, Graz, Austria (2009)

Zhang, Z.; Rashkova, B.; Dehm, G.; Lazar, P.; Redinger, J.; Podloucky, R.: Atomic and electronic structural studies of VN/MgO (001) interface by an image-side C_s-corrected electron microscope. In: 9th Multinational Microscopy Conference 2009, pp. 15 - 16 (Eds. Kothleitner, G.; Leisch, M.). 9th Multinational Microscopy Conference 2009, Graz, Austria, August 30, 2009 - September 04, 2009. (2009)

Rashkova, B.; Kothleitner, G.; Šturm, S.; Scheu, C.; Kutschej, K.; Mitterer, C.; Lazar, P.; Redinger, J.; Podloucky, R.; Dehm, G.: A Comparison of the Electronic Structure of N–K in TiN and VN using EELS and Ab-initio Calculations. In: Proceeding 33rd Microscopy Conference, Deutsche Gesellschaft für Elektronenmikroskopie, pp. 414 - 415. Microscopy 33rd Conference, Deutsche Gesellschaft für Elektronenmikroskopie, Saarbrücken, Germany, September 02, 2007 - September 07, 2007. (2007)