Publications of Felipe Ferraz Morgado

Zhu, Y.; Heo, T. W.; Rodriguez, J. N.; Weber, P. K.; Shi, R.; Baer, B. J.; Morgado, F. F.; Antonov, S.; Kweon, K. E.; Watkins, E. B. et al.; Savage, D. J.; Chapman, J. E.; Keilbart, N. D.; Song, Y.; Zhen, Q.; Gault, B.; Vogel, S. C.; Sen-Britain, S. T.; Shalloo, M. G.; Orme, C.; Bagge-Hansen, M.; Hahn, C.; Pham, T. A.; Macdonald, D. D.; Qiu, R. S.; Wood, B. C.: Hydriding of titanium: Recent trends and perspectives in advanced characterization and multiscale modeling. Current Opinion in Solid State and Materials Science 26, 101020 (2022)

Morgado, F. F.; Katnagallu, S.; Freysoldt, C.; Klaes, B.; Vurpillot, F.; Neugebauer, J.; Raabe, D.; Neumeier, S.; Gault, B.; Stephenson, L.: Revealing atomic-scale vacancy-solute interaction in nickel. Scripta Materialia 203, 114036 (2021)

Morgado, F. F.; Katnagallu, S.; Freysoldt, C.; Klaes, B.; Vurpillot, F.; Neugebauer, J.; Raabe, D.; Neumeier, S.; Gault, B.; Stephenson, L.: Corrigendum to Revealing atomic-scale vacancy-solute interaction in nickel (Scripta Materialia (2021) 203, (114036) (S135964622100316X), (10.1016/j.scriptamat.2021.114036)). Scripta Materialia 205, 114213 (2021)

Gault, B.; Klaes, B.; Morgado, F. F.; Freysoldt, C.; Li, Y.; De Geuser, F.; Stephenson, L.; Vurpillot, F.: Reflections on the Spatial Performance of Atom Probe Tomography in the Analysis of Atomic Neighborhoods. Microscopy and Microanalysis, pp. 1 - 11 (2021)

Katnagallu, S.; Morgado, F. F.; Mouton, I.; Gault, B.; Stephenson, L.: Three-Dimensional Atomically Resolved Analytical Imaging with a Field Ion Microscope. Microscopy and Microanalysis, pp. 1 - 16 (2021)

Klaes, B.; Renaux, J.; Lardé, R.; Delaroche, F.; Morgado, F. F.; Stephenson, L.; Gault, B.; Vurpillot, F.: Analytical Three-Dimensional Field Ion Microscopy of an Amorphous Glass FeBSi. Microscopy and Microanalysis, pp. 1 - 9 (2021)

Rousseau, L.; Normand, A.; Morgado, F. F.; Stephenson, L.; Gault, B.; Tehrani, K.; Vurpillot, F.: Dynamic Effects in Voltage Pulsed Atom Probe. Microscopy and Microanalysis 26 (6), pp. 1133 - 1146 (2020)