Publications of Lars Hoffmann
102 (13), 132112 (2013)Measurement of the indium concentration in high indium content InGaN layers by scanning transmission electron microscopy and atom probe tomography. Applied Physics Letters
471, 012009. 18th Microscopy of Semiconducting Materials Conference, MSM 2013, Oxford, UK, April 07, 2013 - April 11, 2013. (2013)Measuring composition in InGaN from HAADF-STEM images and studying the temperature dependence of Z-contrast. In: Journal of Physics: Conference Series, Vol.