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Klaes, B.; Lardé, R.; Delaroche, F.; Parviainen, S.; Rolland, N.; Katnagallu, S.; Gault, B.; Vurpillot, F.: A model to predict image formation in the three-dimensional field ion microscope. Computer Physics Communications 260, 107317 (2021)

Katnagallu, S.; Dagan, M.; Parviainen, S.; Nematollahi, G. A.; Grabowski, B.; Bagot, P. A. J.; Rolland, N.; Neugebauer, J.; Raabe, D.; Vurpillot, F. et al.; Moody, M. P.; Gault, B.: Impact of local electrostatic field rearrangement on field ionization. Journal of Physics D: Applied Physics 51 (10), 105601, pp. 1 - 10 (2018)

Parviainen, S.; Dagan, M.; Katnagallu, S.; Gault, B.; Moody, M. P.; Vurpillot, F.: Atomistic Simulations of Surface Effects Under High Electric Fields. In: Proceedings of Microscopy & Microanalysis 2017, Vol. 23, pp. 644 - 645. Microscopy & Microanalysis 2017, St. Louis, Missouri, USA, August 06, 2017 - August 10, 2017. (2017)

Gault, B.; De Geuser, F.; Katnagallu, S.; Nematollahi, G. A.; Dagan, M.; Parviainen, S.; Rusitzka, A. K.; Johnson, E.; Sundell, G.; Andersson, M. et al.; Stephenson, L.; Neugebauer, J.; Moody, M. P.; Vurpillot, F.; Raabe, D.: Reconstructing field ion microscopy and atom probe data. Australian Atom Probe Workshop, Magnetic Island, Australia (2017)