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Journal Article (5)

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  2. 2.
    Journal Article
    Eder, K.; Felfer, P. J.; Gault, B.; Ceguerre, A. V.; La Fontaine, A.; Masters, A. F.; Maschmeyer, T.; Cairney, J. M.: A New Approach to Understand the Adsorption of Thiophene on Different Surfaces: An Atom Probe Investigation of Self-Assembled Monolayers. Langmuir 33 (38), pp. 9573 - 9581 (2017)
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    Journal Article
    Cairney, J. M.; Gault, B.; Larson, D. J.: Recognizing 60 years of achievements in field emission and atomic scale microscopy: Reflections on the International Field Emission Society. Materials Today 19 (4), pp. 182 - 183 (2016)
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    Journal Article
    Cairney, J. M.; Rajan, K. K.; Haley, D.; Gault, B.; Bagot, P. A. J.; Choi, P.-P.; Felfer, P. J.; Ringer, S. P.; Marceau, R. K. W.; Moody, M. P.: Mining information from atom probe data. Ultramicroscopy 159, pp. 324 - 337 (2015)
  5. 5.
    Journal Article
    Ceguerra, A. V.; Breen, A. J.; Stephenson, L.; Felfer, P. J.; Araullo-Peters, V. J.; Liddicoat, P. V.; Cui, X. Y.; Yao, L.; Haley, D.; Moody, M. P. et al.; Gault, B.; Cairney, J. M.; Ringer, S. P.: The rise of computational techniques in atom probe microscopy. Current Opinion in Solid State and Materials Science 17 (5), pp. 224 - 235 (2013)
 
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