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Zeitschriftenartikel (6)

2.
Zeitschriftenartikel
Eder, K.; Felfer, P. J.; Gault, B.; Ceguerre, A. V.; La Fontaine, A.; Masters, A. F.; Maschmeyer, T.; Cairney, J. M.: A New Approach to Understand the Adsorption of Thiophene on Different Surfaces: An Atom Probe Investigation of Self-Assembled Monolayers. Langmuir 33 (38), S. 9573 - 9581 (2017)
3.
Zeitschriftenartikel
Cairney, J. M.; Gault, B.; Larson, D. J.: Recognizing 60 years of achievements in field emission and atomic scale microscopy: Reflections on the International Field Emission Society. Materials Today 19 (4), S. 182 - 183 (2016)
4.
Zeitschriftenartikel
Aughterson, R. D.; Lumpkin, G. R.; de Los Reyes, M.; Gault, B.; Baldo, P. M.; Ryan, E. A.; Whittle, K. R.; Smith, K. L. W.; Cairney, J. M.: The influence of crystal structure on ion-irradiation tolerance in the Sm(x)Yb(2-x)TiO5 series. Journal of Nuclear Materials 471, S. 17 - 24 (2016)
5.
Zeitschriftenartikel
Cairney, J. M.; Rajan, K. K.; Haley, D.; Gault, B.; Bagot, P. A. J.; Choi, P.-P.; Felfer, P. J.; Ringer, S. P.; Marceau, R. K. W.; Moody, M. P.: Mining information from atom probe data. Ultramicroscopy 159, S. 324 - 337 (2015)
6.
Zeitschriftenartikel
Ceguerra, A. V.; Breen, A. J.; Stephenson, L.; Felfer, P. J.; Araullo-Peters, V. J.; Liddicoat, P. V.; Cui, X. Y.; Yao, L.; Haley, D.; Moody, M. P. et al.; Gault, B.; Cairney, J. M.; Ringer, S. P.: The rise of computational techniques in atom probe microscopy. Current Opinion in Solid State and Materials Science 17 (5), S. 224 - 235 (2013)
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