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Conference Paper (1)

1.
Conference Paper
Stoffers, A.; Cojocaru-Mirédin, O.; Breitenstein, O.; Seifert, W.; Zaefferer, S.; Raabe, D.: Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. In: 2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014, 6925089, pp. 42 - 46. 40th IEEE Photovoltaic Specialist Conference, PVSC 2014, Denver, CO, USA, June 08, 2014 - June 13, 2014. (2014)

Talk (2)

2.
Talk
Stoffers, A.; Cojocaru-Mirédin, O.; Breitenstein, O.; Seifert, W.; Zaefferer, S.; Raabe, D.: Grain boundary characterization in multicrystalline silicon using joint EBSD, EBIC, and atom probe tomography. 40th IEEE Photovoltaic Specialists Conference, Denver, CO, USA (2014)
3.
Talk
Stoffers, A.; Cojocaru-Mirédin, O.; Breitenstein, O.; Seifert, W.; Raabe, D.: Recombination activity at the atomic scale: Correlative analysis of grain boundaries in multicrystalline silicon solar cells. Euromat 2013, Sevilla, Spain (2013)
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